Three-dimensional total internal reflection microscopy

P. Scott Carney, John C. Schotland

Research output: Contribution to journalArticlepeer-review


We investigate the inverse-scattering problem that arises in total internal reflection microscopy. An analytic solution to this problem within the weak-scattering approximation is used to develop a novel form of three-dimensional microscopy with subwavelength resolution.

Original languageEnglish (US)
Pages (from-to)1072-1074
Number of pages3
JournalOptics Letters
Issue number14
StatePublished - Jul 15 2001
Externally publishedYes

ASJC Scopus subject areas

  • Atomic and Molecular Physics, and Optics


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