Thermally Triggered Degradation of Transient Electronic Devices
- Chan Woo Park
- , Seung Kyun Kang
- , Hector Lopez Hernandez
- , Joshua A. Kaitz
- , Dae Seung Wie
- , Jiho Shin
- , Olivia P. Lee
- , Nancy R. Sottos
- , Jeffrey S. Moore
- , John A. Rogers
- , Scott R. White
- Materials Science and Engineering
- Beckman Institute for Advanced Science and Technology
- Materials Research Lab
- Mechanical Science and Engineering
- Aerospace Engineering
- Chemistry
- Carl R. Woese Institute for Genomic Biology
- Center for Advanced Study
- Biomedical and Translational Sciences
- Social & Behavioral Sciences Institute
Research output: Contribution to journal › Article › peer-review