Thermally Triggered Degradation of Transient Electronic Devices

Chan Woo Park, Seung Kyun Kang, Hector Lopez Hernandez, Joshua A. Kaitz, Dae Seung Wie, Jiho Shin, Olivia P. Lee, Nancy R. Sottos, Jeffrey S. Moore, John A. Rogers, Scott R. White

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Chemical Compounds

Engineering & Materials Science