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Thermally Triggered Degradation of Transient Electronic Devices

  • Chan Woo Park
  • , Seung Kyun Kang
  • , Hector Lopez Hernandez
  • , Joshua A. Kaitz
  • , Dae Seung Wie
  • , Jiho Shin
  • , Olivia P. Lee
  • , Nancy R. Sottos
  • , Jeffrey S. Moore
  • , John A. Rogers
  • , Scott R. White

Research output: Contribution to journalArticlepeer-review

Abstract

Thermally triggered transient electronics using wax-encapsulated acid, which enable rapid device destruction via acidic degradation of the metal electronic components are reported. Using a cyclic poly(phthalaldehyde) (cPPA) substrate affords a more rapid destruction of the device due to acidic depolymerization of cPPA.

Original languageEnglish (US)
Pages (from-to)3783-3788
Number of pages6
JournalAdvanced Materials
Volume27
Issue number25
DOIs
StatePublished - Jul 1 2015

Keywords

  • heat triggers
  • remote triggering
  • transient electronics
  • triggered degradation
  • wax encapsulation

ASJC Scopus subject areas

  • General Materials Science
  • Mechanics of Materials
  • Mechanical Engineering

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