Thermally Triggered Degradation of Transient Electronic Devices

Chan Woo Park, Seung Kyun Kang, Hector Lopez Hernandez, Joshua A. Kaitz, Dae Seung Wie, Jiho Shin, Olivia P. Lee, Nancy R. Sottos, Jeffrey S. Moore, John A. Rogers, Scott R. White

Research output: Contribution to journalArticle

Abstract

Thermally triggered transient electronics using wax-encapsulated acid, which enable rapid device destruction via acidic degradation of the metal electronic components are reported. Using a cyclic poly(phthalaldehyde) (cPPA) substrate affords a more rapid destruction of the device due to acidic depolymerization of cPPA.

Original languageEnglish (US)
Pages (from-to)3783-3788
Number of pages6
JournalAdvanced Materials
Volume27
Issue number25
DOIs
StatePublished - Jul 1 2015

    Fingerprint

Keywords

  • heat triggers
  • remote triggering
  • transient electronics
  • triggered degradation
  • wax encapsulation

ASJC Scopus subject areas

  • Materials Science(all)
  • Mechanics of Materials
  • Mechanical Engineering

Cite this

Park, C. W., Kang, S. K., Hernandez, H. L., Kaitz, J. A., Wie, D. S., Shin, J., Lee, O. P., Sottos, N. R., Moore, J. S., Rogers, J. A., & White, S. R. (2015). Thermally Triggered Degradation of Transient Electronic Devices. Advanced Materials, 27(25), 3783-3788. https://doi.org/10.1002/adma.201501180