Abstract
Scanning tunneling microscopy and low energy electron microscopy were used to explore film-induced stripes formed by two variants of an O-induced surface reconstruction of Nb(011) films grown on Al2O3. As a result, it was possible to document the high strain sensitivity of the stripes, and their fixed period of 51±5 nm at the temperature 1505 K at which the reconstructions are lifted.
Original language | English (US) |
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Article number | 116102 |
Pages (from-to) | 116102/1-116102/4 |
Journal | Physical review letters |
Volume | 87 |
Issue number | 11 |
State | Published - Sep 10 2001 |
ASJC Scopus subject areas
- General Physics and Astronomy