Scanning tunneling microscopy and low energy electron microscopy were used to explore film-induced stripes formed by two variants of an O-induced surface reconstruction of Nb(011) films grown on Al2O3. As a result, it was possible to document the high strain sensitivity of the stripes, and their fixed period of 51±5 nm at the temperature 1505 K at which the reconstructions are lifted.
|Original language||English (US)|
|Journal||Physical review letters|
|State||Published - Sep 10 2001|
ASJC Scopus subject areas
- Physics and Astronomy(all)