Thermal conductivity measurement from 30 to 750 K: The 3ω method

David G. Cahill

doi:10.1063/1.1141498

Thermal conductivity measurement from 30 to 750 K: The 3ω method

Research output: Contribution to journal › Article › peer-review

Abstract

An ac technique for measuring the thermal conductivity of dielectric solids between 30 and 750 K is described. This technique, the 3ω method, can be applied to bulk amorphous solids and crystals as well as amorphous films tens of microns thick. Errors from black-body radiation are calculated to be less than 2% even at 1000 K. Data for a-SiO₂, Pyrex 7740, and Pyroceram 9606 are compared to results obtained by conventional techniques.

Original language	English (US)
Pages (from-to)	802-808
Number of pages	7
Journal	Review of Scientific Instruments
Volume	61
Issue number	2
DOIs	https://doi.org/10.1063/1.1141498
State	Published - Dec 1 1990
Externally published	Yes

ASJC Scopus subject areas

Instrumentation

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abstract = "An ac technique for measuring the thermal conductivity of dielectric solids between 30 and 750 K is described. This technique, the 3ω method, can be applied to bulk amorphous solids and crystals as well as amorphous films tens of microns thick. Errors from black-body radiation are calculated to be less than 2% even at 1000 K. Data for a-SiO2, Pyrex 7740, and Pyroceram 9606 are compared to results obtained by conventional techniques.",

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AB - An ac technique for measuring the thermal conductivity of dielectric solids between 30 and 750 K is described. This technique, the 3ω method, can be applied to bulk amorphous solids and crystals as well as amorphous films tens of microns thick. Errors from black-body radiation are calculated to be less than 2% even at 1000 K. Data for a-SiO2, Pyrex 7740, and Pyroceram 9606 are compared to results obtained by conventional techniques.

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