Abstract
The use of time-domain thermoreflectance (TDTR) method at a fixed delay time to image the thermal conductivity of the cross-section of thermal barrier coatings with micron-scale resolution was described. The method is used to measure the thermal conductivity of amorphous SiO 2, single crystal 8 wt% YSZ, and a NiCr alloy. The thermal conductivity of the as-deposited yttria-stabilized zirconia coatings is found to be 1.84±0.08 W m -1 K -1 in the in-plane direction and 1.7±0.25 W m -1 K -1 in the through-thickness direction. The in-plane thermal conductivity is found to increase to 2.2±0.0 W m -1 K -1 after 500 furnace cycles.
Original language | English (US) |
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Pages (from-to) | 622-626 |
Number of pages | 5 |
Journal | Advanced Engineering Materials |
Volume | 7 |
Issue number | 7 |
DOIs | |
State | Published - Jul 2005 |
ASJC Scopus subject areas
- General Materials Science
- Condensed Matter Physics