Thermal conductivity imaging of thermal barrier coatings

Xuan Zheng, David G Cahill, Ji Cheng Zhao

Research output: Contribution to journalArticle

Abstract

The use of time-domain thermoreflectance (TDTR) method at a fixed delay time to image the thermal conductivity of the cross-section of thermal barrier coatings with micron-scale resolution was described. The method is used to measure the thermal conductivity of amorphous SiO 2, single crystal 8 wt% YSZ, and a NiCr alloy. The thermal conductivity of the as-deposited yttria-stabilized zirconia coatings is found to be 1.84±0.08 W m -1 K -1 in the in-plane direction and 1.7±0.25 W m -1 K -1 in the through-thickness direction. The in-plane thermal conductivity is found to increase to 2.2±0.0 W m -1 K -1 after 500 furnace cycles.

Original languageEnglish (US)
Pages (from-to)622-626
Number of pages5
JournalAdvanced Engineering Materials
Volume7
Issue number7
DOIs
StatePublished - Jul 1 2005

ASJC Scopus subject areas

  • Materials Science(all)
  • Condensed Matter Physics

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