Thermal conductivity as a metric for the crystalline quality of SrTiO 3 epitaxial layers

Dong Wook Oh; Jayakanth Ravichandran; Chen Wei Liang; Wolter Siemons; Bharat Jalan; Charles M. Brooks; Mark Huijben; Darrell G. Schlom; Susanne Stemmer; Lane W. Martin; Arun Majumdar; Ramamoorthy Ramesh; David G. Cahill

doi:10.1063/1.3579993

Thermal conductivity as a metric for the crystalline quality of SrTiO ₃ epitaxial layers

Dong Wook Oh, Jayakanth Ravichandran, Chen Wei Liang, Wolter Siemons, Bharat Jalan, Charles M. Brooks, Mark Huijben, Darrell G. Schlom, Susanne Stemmer, Lane W. Martin, Arun Majumdar, Ramamoorthy Ramesh, David G. Cahill

Research output: Contribution to journal › Article

Abstract

Measurements of thermal conductivity by time-domain thermoreflectance in the temperature range 100<T<300 K are used to characterize the crystalline quality of epitaxial layers of a prototypical oxide, SrTiO₃. Twenty samples from five institutions using two growth techniques, molecular beam epitaxy and pulsed laser deposition (PLD), were analyzed. Optimized growth conditions produce layers with comparable to bulk single crystals. Many PLD layers, particularly those that use ceramics as the target material, show surprisingly low . For homoepitaxial layers, the decrease in created by point defects correlates well with the expansion of the lattice parameter in the direction normal to the surface.

Original language	English (US)
Article number	221904
Journal	Applied Physics Letters
Volume	98
Issue number	22
DOIs	https://doi.org/10.1063/1.3579993
State	Published - May 30 2011

ASJC Scopus subject areas

Physics and Astronomy (miscellaneous)

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10.1063/1.3579993

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Oh, D. W., Ravichandran, J., Liang, C. W., Siemons, W., Jalan, B., Brooks, C. M., Huijben, M., Schlom, D. G., Stemmer, S., Martin, L. W., Majumdar, A., Ramesh, R., & Cahill, D. G. (2011). Thermal conductivity as a metric for the crystalline quality of SrTiO ₃ epitaxial layers. Applied Physics Letters, 98(22), [221904]. https://doi.org/10.1063/1.3579993

Thermal conductivity as a metric for the crystalline quality of SrTiO ₃ epitaxial layers. / Oh, Dong Wook; Ravichandran, Jayakanth; Liang, Chen Wei; Siemons, Wolter; Jalan, Bharat; Brooks, Charles M.; Huijben, Mark; Schlom, Darrell G.; Stemmer, Susanne; Martin, Lane W.; Majumdar, Arun; Ramesh, Ramamoorthy; Cahill, David G.

In: Applied Physics Letters, Vol. 98, No. 22, 221904, 30.05.2011.

Research output: Contribution to journal › Article

Oh, Dong Wook ; Ravichandran, Jayakanth ; Liang, Chen Wei ; Siemons, Wolter ; Jalan, Bharat ; Brooks, Charles M. ; Huijben, Mark ; Schlom, Darrell G. ; Stemmer, Susanne ; Martin, Lane W. ; Majumdar, Arun ; Ramesh, Ramamoorthy ; Cahill, David G. / Thermal conductivity as a metric for the crystalline quality of SrTiO ₃ epitaxial layers. In: Applied Physics Letters. 2011 ; Vol. 98, No. 22.

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abstract = "Measurements of thermal conductivity by time-domain thermoreflectance in the temperature range 100<T<300 K are used to characterize the crystalline quality of epitaxial layers of a prototypical oxide, SrTiO3. Twenty samples from five institutions using two growth techniques, molecular beam epitaxy and pulsed laser deposition (PLD), were analyzed. Optimized growth conditions produce layers with comparable to bulk single crystals. Many PLD layers, particularly those that use ceramics as the target material, show surprisingly low . For homoepitaxial layers, the decrease in created by point defects correlates well with the expansion of the lattice parameter in the direction normal to the surface.",

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