Thermal conductance of strongly bonded metal-oxide interfaces

R. B. Wilson, Brent A. Apgar, Wen Pin Hsieh, Lane W. Martin, David G. Cahill

Research output: Contribution to journalArticle

Abstract

We report the results of time-domain thermoreflectance (TDTR) measurements of two strongly bonded metal-oxide systems with unusually large thermal conductances. We find that TDTR data for the epitaxial SrRuO3/SrTiO3 interface is consistent with an interface conductance G>0.8GWm-2K-1. For an Al/MgO interface at a pressure of 60 GPa, we find G≈1.1GWm-2K-1. Both are within 40% of the maximum possible conductance for these systems, as predicted by simple theory.

Original languageEnglish (US)
Article number115414
JournalPhysical Review B - Condensed Matter and Materials Physics
Volume91
Issue number11
DOIs
StatePublished - Mar 11 2015

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Condensed Matter Physics

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