Abstract
A small-signal model of active clamp circuits is developed and used to explore how the trigger circuit design impacts the power integrity during ESD events. Analysis and simulation show that low gain, high bandwidth trigger circuits promote stability, indicating a tradeoff between clamp on-resistance, stability, and area.
| Original language | English (US) |
|---|---|
| Journal | Electrical Overstress/Electrostatic Discharge Symposium Proceedings |
| Volume | 2014-November |
| Issue number | November |
| State | Published - Nov 26 2014 |
| Event | 36th International Electrical Overstress/Electrostatic Discharge Symposium, EOS/ESD 2014 - Tucson, United States Duration: Sep 7 2014 → Sep 12 2014 |
ASJC Scopus subject areas
- Electrical and Electronic Engineering
Fingerprint Dive into the research topics of 'Theory of active clamp response to power-on ESD and implications for power supply integrity'. Together they form a unique fingerprint.
Cite this
Mertens, R., Thomson, N., Xiu, Y., & Rosenbaum, E. (2014). Theory of active clamp response to power-on ESD and implications for power supply integrity. Electrical Overstress/Electrostatic Discharge Symposium Proceedings, 2014-November(November).