A small-signal model of active clamp circuits is developed and used to explore how the trigger circuit design impacts the power integrity during ESD events. Analysis and simulation show that low gain, high bandwidth trigger circuits promote stability, indicating a tradeoff between clamp on-resistance, stability, and area.
|Original language||English (US)|
|Journal||Electrical Overstress/Electrostatic Discharge Symposium Proceedings|
|State||Published - Nov 26 2014|
|Event||36th International Electrical Overstress/Electrostatic Discharge Symposium, EOS/ESD 2014 - Tucson, United States|
Duration: Sep 7 2014 → Sep 12 2014
ASJC Scopus subject areas
- Electrical and Electronic Engineering