Theory of active clamp response to power-on ESD and implications for power supply integrity

Robert Mertens; Nicholas Thomson; Yang Xiu; Elyse Rosenbaum

Theory of active clamp response to power-on ESD and implications for power supply integrity

Robert Mertens, Nicholas Thomson, Yang Xiu, Elyse Rosenbaum

Research output: Contribution to journal › Conference article › peer-review

Abstract

A small-signal model of active clamp circuits is developed and used to explore how the trigger circuit design impacts the power integrity during ESD events. Analysis and simulation show that low gain, high bandwidth trigger circuits promote stability, indicating a tradeoff between clamp on-resistance, stability, and area.

Original language	English (US)
Journal	Electrical Overstress/Electrostatic Discharge Symposium Proceedings
Volume	2014-November
Issue number	November
State	Published - Nov 26 2014
Event	36th International Electrical Overstress/Electrostatic Discharge Symposium, EOS/ESD 2014 - Tucson, United States Duration: Sep 7 2014 → Sep 12 2014

ASJC Scopus subject areas

Electrical and Electronic Engineering

Library availability

Discover UIUC Full Text

Cite this

@article{d52ec66c8c70497e87a07bbf1eb57865,

title = "Theory of active clamp response to power-on ESD and implications for power supply integrity",

abstract = "A small-signal model of active clamp circuits is developed and used to explore how the trigger circuit design impacts the power integrity during ESD events. Analysis and simulation show that low gain, high bandwidth trigger circuits promote stability, indicating a tradeoff between clamp on-resistance, stability, and area.",

author = "Robert Mertens and Nicholas Thomson and Yang Xiu and Elyse Rosenbaum",

year = "2014",

month = nov,

day = "26",

language = "English (US)",

volume = "2014-November",

journal = "Electrical Overstress/Electrostatic Discharge Symposium Proceedings",

issn = "0739-5159",

number = "November",

note = "36th International Electrical Overstress/Electrostatic Discharge Symposium, EOS/ESD 2014 ; Conference date: 07-09-2014 Through 12-09-2014",

}

TY - JOUR

T1 - Theory of active clamp response to power-on ESD and implications for power supply integrity

AU - Mertens, Robert

AU - Thomson, Nicholas

AU - Xiu, Yang

AU - Rosenbaum, Elyse

PY - 2014/11/26

Y1 - 2014/11/26

N2 - A small-signal model of active clamp circuits is developed and used to explore how the trigger circuit design impacts the power integrity during ESD events. Analysis and simulation show that low gain, high bandwidth trigger circuits promote stability, indicating a tradeoff between clamp on-resistance, stability, and area.

AB - A small-signal model of active clamp circuits is developed and used to explore how the trigger circuit design impacts the power integrity during ESD events. Analysis and simulation show that low gain, high bandwidth trigger circuits promote stability, indicating a tradeoff between clamp on-resistance, stability, and area.

UR - http://www.scopus.com/inward/record.url?scp=84938099122&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=84938099122&partnerID=8YFLogxK

M3 - Conference article

AN - SCOPUS:84938099122

VL - 2014-November

JO - Electrical Overstress/Electrostatic Discharge Symposium Proceedings

JF - Electrical Overstress/Electrostatic Discharge Symposium Proceedings

SN - 0739-5159

IS - November

T2 - 36th International Electrical Overstress/Electrostatic Discharge Symposium, EOS/ESD 2014

Y2 - 7 September 2014 through 12 September 2014

ER -

Theory of active clamp response to power-on ESD and implications for power supply integrity

Abstract

ASJC Scopus subject areas

Library availability

Related links

Fingerprint

Cite this