Theory of active clamp response to power-on ESD and implications for power supply integrity

Robert Mertens, Nicholas Thomson, Yang Xiu, Elyse Rosenbaum

Research output: Contribution to journalConference article

Abstract

A small-signal model of active clamp circuits is developed and used to explore how the trigger circuit design impacts the power integrity during ESD events. Analysis and simulation show that low gain, high bandwidth trigger circuits promote stability, indicating a tradeoff between clamp on-resistance, stability, and area.

Original languageEnglish (US)
JournalElectrical Overstress/Electrostatic Discharge Symposium Proceedings
Volume2014-November
Issue numberNovember
StatePublished - Nov 26 2014
Event36th International Electrical Overstress/Electrostatic Discharge Symposium, EOS/ESD 2014 - Tucson, United States
Duration: Sep 7 2014Sep 12 2014

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Trigger circuits
Clamping devices
Bandwidth
Networks (circuits)

ASJC Scopus subject areas

  • Electrical and Electronic Engineering

Cite this

Theory of active clamp response to power-on ESD and implications for power supply integrity. / Mertens, Robert; Thomson, Nicholas; Xiu, Yang; Rosenbaum, Elyse.

In: Electrical Overstress/Electrostatic Discharge Symposium Proceedings, Vol. 2014-November, No. November, 26.11.2014.

Research output: Contribution to journalConference article

@article{d52ec66c8c70497e87a07bbf1eb57865,
title = "Theory of active clamp response to power-on ESD and implications for power supply integrity",
abstract = "A small-signal model of active clamp circuits is developed and used to explore how the trigger circuit design impacts the power integrity during ESD events. Analysis and simulation show that low gain, high bandwidth trigger circuits promote stability, indicating a tradeoff between clamp on-resistance, stability, and area.",
author = "Robert Mertens and Nicholas Thomson and Yang Xiu and Elyse Rosenbaum",
year = "2014",
month = "11",
day = "26",
language = "English (US)",
volume = "2014-November",
journal = "Electrical Overstress/Electrostatic Discharge Symposium Proceedings",
issn = "0739-5159",
number = "November",

}

TY - JOUR

T1 - Theory of active clamp response to power-on ESD and implications for power supply integrity

AU - Mertens, Robert

AU - Thomson, Nicholas

AU - Xiu, Yang

AU - Rosenbaum, Elyse

PY - 2014/11/26

Y1 - 2014/11/26

N2 - A small-signal model of active clamp circuits is developed and used to explore how the trigger circuit design impacts the power integrity during ESD events. Analysis and simulation show that low gain, high bandwidth trigger circuits promote stability, indicating a tradeoff between clamp on-resistance, stability, and area.

AB - A small-signal model of active clamp circuits is developed and used to explore how the trigger circuit design impacts the power integrity during ESD events. Analysis and simulation show that low gain, high bandwidth trigger circuits promote stability, indicating a tradeoff between clamp on-resistance, stability, and area.

UR - http://www.scopus.com/inward/record.url?scp=84938099122&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=84938099122&partnerID=8YFLogxK

M3 - Conference article

AN - SCOPUS:84938099122

VL - 2014-November

JO - Electrical Overstress/Electrostatic Discharge Symposium Proceedings

JF - Electrical Overstress/Electrostatic Discharge Symposium Proceedings

SN - 0739-5159

IS - November

ER -