Abstract
A small-signal model of active clamp circuits is developed and used to explore how the trigger circuit design impacts the power integrity during ESD events. Analysis and simulation show that low gain, high bandwidth trigger circuits promote stability, indicating a tradeoff between clamp on-resistance, stability, and area.
| Original language | English (US) |
|---|---|
| Journal | Electrical Overstress/Electrostatic Discharge Symposium Proceedings |
| Volume | 2014-November |
| Issue number | November |
| State | Published - Nov 26 2014 |
| Event | 36th International Electrical Overstress/Electrostatic Discharge Symposium, EOS/ESD 2014 - Tucson, United States Duration: Sep 7 2014 → Sep 12 2014 |
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ASJC Scopus subject areas
- Electrical and Electronic Engineering
Cite this
Theory of active clamp response to power-on ESD and implications for power supply integrity. / Mertens, Robert; Thomson, Nicholas; Xiu, Yang; Rosenbaum, Elyse.
In: Electrical Overstress/Electrostatic Discharge Symposium Proceedings, Vol. 2014-November, No. November, 26.11.2014.Research output: Contribution to journal › Conference article
}
TY - JOUR
T1 - Theory of active clamp response to power-on ESD and implications for power supply integrity
AU - Mertens, Robert
AU - Thomson, Nicholas
AU - Xiu, Yang
AU - Rosenbaum, Elyse
PY - 2014/11/26
Y1 - 2014/11/26
N2 - A small-signal model of active clamp circuits is developed and used to explore how the trigger circuit design impacts the power integrity during ESD events. Analysis and simulation show that low gain, high bandwidth trigger circuits promote stability, indicating a tradeoff between clamp on-resistance, stability, and area.
AB - A small-signal model of active clamp circuits is developed and used to explore how the trigger circuit design impacts the power integrity during ESD events. Analysis and simulation show that low gain, high bandwidth trigger circuits promote stability, indicating a tradeoff between clamp on-resistance, stability, and area.
UR - http://www.scopus.com/inward/record.url?scp=84938099122&partnerID=8YFLogxK
UR - http://www.scopus.com/inward/citedby.url?scp=84938099122&partnerID=8YFLogxK
M3 - Conference article
AN - SCOPUS:84938099122
VL - 2014-November
JO - Electrical Overstress/Electrostatic Discharge Symposium Proceedings
JF - Electrical Overstress/Electrostatic Discharge Symposium Proceedings
SN - 0739-5159
IS - November
ER -