Theory of active clamp response to power-on ESD and implications for power supply integrity

Robert Mertens, Nicholas Thomson, Yang Xiu, Elyse Rosenbaum

Research output: Contribution to journalConference article

Abstract

A small-signal model of active clamp circuits is developed and used to explore how the trigger circuit design impacts the power integrity during ESD events. Analysis and simulation show that low gain, high bandwidth trigger circuits promote stability, indicating a tradeoff between clamp on-resistance, stability, and area.

Original languageEnglish (US)
JournalElectrical Overstress/Electrostatic Discharge Symposium Proceedings
Volume2014-November
Issue numberNovember
StatePublished - Nov 26 2014
Event36th International Electrical Overstress/Electrostatic Discharge Symposium, EOS/ESD 2014 - Tucson, United States
Duration: Sep 7 2014Sep 12 2014

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ASJC Scopus subject areas

  • Electrical and Electronic Engineering

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