The per-unit-length capacitance matrix of flaring VLSI packaging interconnections

Ahmed A. Omer, Andreas C. Cangellaris, Mehdi M. Mechaik, John L. Prince

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

A three-dimensional capacitance calculator is used for the accurate calculation of the per-unit-length capacitance matrix of flaring, multiple, coupled microstrip and stripline interconnections. Properly constructed Green's functions that satisfy the boundary conditions at dielectric interfaces are implemented in order to minimize the number of unknowns involved in the numerical solution. Under the assumption that the longitudinal components of the electric and magnetic fields are negligible compared to the transverse ones, the per-unit-length inductance matrix is also found from the inverse of the capacitance matrix calculated for the same conductor geometry in a uniform dielectric medium.

Original languageEnglish (US)
Title of host publicationProceedings - Electronic Components Conference
PublisherPubl by IEEE
Pages55-61
Number of pages7
ISBN (Print)0780300122
StatePublished - Dec 1 1991
Externally publishedYes
EventProceedings of the 41st Electronic Components & Technology Conference - Atlanta, GA, USA
Duration: May 11 1991May 16 1991

Publication series

NameProceedings - Electronic Components Conference
ISSN (Print)0569-5503

Other

OtherProceedings of the 41st Electronic Components & Technology Conference
CityAtlanta, GA, USA
Period5/11/915/16/91

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Electrical and Electronic Engineering

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