The Formation and utility of sub-angstrom to nanometer-sized electron probes in the aberration-corrected transmission electron microscope at the University of Illinois
Jianguo Wen, James Mabon, Changhui Lei, Steve Burdin, Ernie Sammann, Ivan Petrov, Amish B. Shah, Varistha Chobpattana, Jiong Zhang, Ke Ran, Jian Min Zuo, Satoshi Mishina, Toshihiro Aoki
Research output: Contribution to journal › Article › peer-review
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