A study was conducted on the electrical turn-on characteristics of vertical-cavity surface-emitting lasers (VCSELs) both experimentally and by simulation. It was demonstrated that distinctively different current-voltage dependencies were associated with spontaneous, Shockley-Read-Hall (SRH), and Auger recombination processes. Based on the observation, the influences of these recombination mechanisms on the VCSELs' threshold current were investigated. This approach enables extraction of important information on optical and thermal properties of laser diodes from direct electrical measurements.
|Original language||English (US)|
|Number of pages||3|
|Journal||Applied Physics Letters|
|State||Published - Nov 17 2003|
ASJC Scopus subject areas
- Physics and Astronomy (miscellaneous)