The effects of xenon implantation in ceria with and without lanthanum

B. Ye, D. Yun, A. J. Oaks, W. Chen, M. A. Kirk, J. Rest, A. M. Yacout, J. F. Stubbins

Research output: Contribution to journalArticle

Abstract

A combination of in situ and ex situ transmission electron microscopy (TEM) experiments was used to study the evolution of defect clusters during implantation of Xe at the energy of 700 keV. Xenon has been implanted into CeO 2 and Ce/LaO 2 single crystal thin films up to doses of 1 × 10 17 ions/cm 2 at room temperature and 600 °C. The evolution of microstructure, especially the formation of solid-state precipitates, during irradiation is found to be a function of material composition, irradiation dose and irradiation temperature. The precipitates are either aggregated Xe in the solid state or metallic Ce due to the active redox reaction in CeO 2 and Ce/LaO 2. Further investigations with the help of X-ray techniques will be carried out in the future.

Original languageEnglish (US)
Pages (from-to)236-238
Number of pages3
JournalNuclear Instruments and Methods in Physics Research, Section B: Beam Interactions with Materials and Atoms
Volume272
DOIs
StatePublished - Feb 1 2012

ASJC Scopus subject areas

  • Nuclear and High Energy Physics
  • Instrumentation

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