TY - JOUR
T1 - The effect of Na in polycrystalline and epitaxial single-crystal CuIn 1-xGaxSe2
AU - Rockett, A.
N1 - I gratefully acknowledge the support of the U.S. Department of Energy through the National Renewable Energy Laboratory and the Basic Energy Sciences Program subcontract DEFG02-91ER45439. Microanalysis was carried out in the Center for Microanalysis of Materials (CMM), supported by the Department of Energy. The author thanks all of the CMM staff for their invaluable help without which this research could not have been accomplished. Finally, I thank my graduate students, postdoctoral researchers, and the many colleagues around the world who have offered samples, comments, and collaborations over the course of this research.
PY - 2005/6/1
Y1 - 2005/6/1
N2 - Na is found to improve the performance of Cu(In,Ga)Se2 (CIGS) solar cells although the mechanism is not clear. This paper briefly reviews some of the observations on Na in CIGS polycrystalline and epitaxial films. Experiments suggest weak electrical effects of Na within grains, primarily by reducing compensation and in some cases by enhancing acceptor concentrations. As it segregates to surfaces, it has been suggested that Na acts through passivation of grain-boundary defects. However, its main effect is on device open-circuit voltage (and somewhat on fill factor), which does not correlate with grain size but rather with bulk grain defects. The Na concentration scales somewhat with grain boundary density averaged over large areas of film, suggesting that it may be active there. Modest Na concentrations often increase grain size in polycrystals, although not when the grain size is already large, and often changes preferred orientation. Na segregates to the surfaces of CIGS grains. These results suggest that it may act at the surface, modifying growth mechanisms or defect organization during growth. TEM evidence shows that strong concentration of Na in the grain boundaries, sufficient to passivate surface defects by itself, is unlikely to occur. Finally, Na is removed from the surface of CIGS by aqueous solutions, such as those used to form the heterojunction. It is concluded that Na acts at the surface during growth to organize point defects, probably including by reduction of vacancy populations, within the bulk grains but that it has no residual effect once growth is complete.
AB - Na is found to improve the performance of Cu(In,Ga)Se2 (CIGS) solar cells although the mechanism is not clear. This paper briefly reviews some of the observations on Na in CIGS polycrystalline and epitaxial films. Experiments suggest weak electrical effects of Na within grains, primarily by reducing compensation and in some cases by enhancing acceptor concentrations. As it segregates to surfaces, it has been suggested that Na acts through passivation of grain-boundary defects. However, its main effect is on device open-circuit voltage (and somewhat on fill factor), which does not correlate with grain size but rather with bulk grain defects. The Na concentration scales somewhat with grain boundary density averaged over large areas of film, suggesting that it may be active there. Modest Na concentrations often increase grain size in polycrystals, although not when the grain size is already large, and often changes preferred orientation. Na segregates to the surfaces of CIGS grains. These results suggest that it may act at the surface, modifying growth mechanisms or defect organization during growth. TEM evidence shows that strong concentration of Na in the grain boundaries, sufficient to passivate surface defects by itself, is unlikely to occur. Finally, Na is removed from the surface of CIGS by aqueous solutions, such as those used to form the heterojunction. It is concluded that Na acts at the surface during growth to organize point defects, probably including by reduction of vacancy populations, within the bulk grains but that it has no residual effect once growth is complete.
KW - Cu(In,Ga)Se
KW - Na concentration
KW - Open-circuit voltage
UR - https://www.scopus.com/pages/publications/18444389193
UR - https://www.scopus.com/pages/publications/18444389193#tab=citedBy
U2 - 10.1016/j.tsf.2004.11.038
DO - 10.1016/j.tsf.2004.11.038
M3 - Article
AN - SCOPUS:18444389193
SN - 0040-6090
VL - 480-481
SP - 2
EP - 7
JO - Thin Solid Films
JF - Thin Solid Films
ER -