The determination of electronic stopping powers of light ions in metals from damage-rate measurements

R. S. Averback, R. Benedek, K. L. Merkle, L. R. Singer

Research output: Contribution to journalArticle

Abstract

We investigate a new technique for the determination of light-ion stopping powers in metals. The radiation-damage-induced resistivity change in thin films is measured as a function of ion energy. As the ion energy is raised, an increasing fraction of the energy passes through the back surface, thereby resulting in decreased damage production. This effect has been analyzed by comparison with predictions based on an Edgeworth expansion of the damage-distribution function, using the moments tabulated by Winterbon. Results are presented for He, Li, and C irradiations of silver films with thicknesses of 2640 and 3880 Å. The present results are compared with those of previous work. Other methods for calculation of the damage-distribution function are compared with the Edgeworth expansion.

Original languageEnglish (US)
Pages (from-to)1273-1278
Number of pages6
JournalJournal of Applied Physics
Volume50
Issue number3
DOIs
StatePublished - Dec 1 1979

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light ions
stopping power
damage
distribution functions
electronics
metals
expansion
radiation damage
energy
ions
silver
moments
electrical resistivity
irradiation
thin films
predictions

ASJC Scopus subject areas

  • Physics and Astronomy(all)

Cite this

The determination of electronic stopping powers of light ions in metals from damage-rate measurements. / Averback, R. S.; Benedek, R.; Merkle, K. L.; Singer, L. R.

In: Journal of Applied Physics, Vol. 50, No. 3, 01.12.1979, p. 1273-1278.

Research output: Contribution to journalArticle

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