The Change of X-ray Diffraction Peak Width during in situ Conventional Sintering of Nanoscale Powders

Jean Marie Lebrun, Shikhar K. Jha, Kiran S. Naik, Kevin C. Seymour, Waltraud M. Kriven, Rishi Raj

Research output: Contribution to journalArticlepeer-review

Abstract

Diffraction peaks of nanoscale particles of 3 mol% yttria-stabilized zirconia become sharper as the powder sinters. The reduction in the peak width is correlated with the increase in density. The sharpening of the peak agrees reasonably well with the remaining free surface area as the sample sinters. Therefore, high curvature of the free surface of the pores is assumed to lead to peak broadening (the grain boundaries that grow at the expense of the free surfaces of the pores do not have this curvature). The change in the grain size during sintering does not make a significant contribution to peak width.

Original languageEnglish (US)
Pages (from-to)765-768
Number of pages4
JournalJournal of the American Ceramic Society
Volume99
Issue number3
DOIs
StatePublished - Mar 2016

ASJC Scopus subject areas

  • Ceramics and Composites
  • Materials Chemistry

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