Terahertz imaging and spectroscopy of largearea single-layer graphene

J. L. Tomaino; A. D. Jameson; J. W. Kevek; M. J. Paul; A. M. Van Der Zande; R. A. Barton; P. L. McEuen; E. D. Minot; Yun Shik Lee

doi:10.1364/OE.19.000141

Terahertz imaging and spectroscopy of largearea single-layer graphene

J. L. Tomaino, A. D. Jameson, J. W. Kevek, M. J. Paul, A. M. Van Der Zande, R. A. Barton, P. L. McEuen, E. D. Minot, Yun Shik Lee

Research output: Contribution to journal › Article › peer-review

Abstract

We demonstrate terahertz (THz) imaging and spectroscopy of a 15 × 15-mm² single-layer graphene film on Si using broadband THz pulses. The THz images clearly map out the THz carrier dynamics of the grapheneon-Si sample, allowing us to measure sheet conductivity with sub-mm resolution without fabricating electrodes. The THz carrier dynamics are dominated by intraband transitions and the THz-induced electron motion is characterized by a flat spectral response. A theoretical analysis based on the Fresnel coefficients for a metallic thin film shows that the local sheet conductivity varies across the sample from σs = 1.7 × 10-^-3 to 2.4 × 10 ^-3 Ω^-1 (sheet resistance, ρs = 420 - 590 Ω/sq).

Original language	English (US)
Pages (from-to)	141-146
Number of pages	6
Journal	Optics Express
Volume	19
Issue number	1
DOIs	https://doi.org/10.1364/OE.19.000141
State	Published - Jan 3 2011
Externally published	Yes

ASJC Scopus subject areas

Atomic and Molecular Physics, and Optics

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10.1364/OE.19.000141

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abstract = "We demonstrate terahertz (THz) imaging and spectroscopy of a 15 × 15-mm2 single-layer graphene film on Si using broadband THz pulses. The THz images clearly map out the THz carrier dynamics of the grapheneon-Si sample, allowing us to measure sheet conductivity with sub-mm resolution without fabricating electrodes. The THz carrier dynamics are dominated by intraband transitions and the THz-induced electron motion is characterized by a flat spectral response. A theoretical analysis based on the Fresnel coefficients for a metallic thin film shows that the local sheet conductivity varies across the sample from σs = 1.7 × 10--3 to 2.4 × 10 -3 Ω-1 (sheet resistance, ρs = 420 - 590 Ω/sq).",

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AU - Jameson, A. D.

AU - Kevek, J. W.

AU - Paul, M. J.

AU - Van Der Zande, A. M.

AU - Barton, R. A.

AU - McEuen, P. L.

AU - Minot, E. D.

AU - Lee, Yun Shik

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Y1 - 2011/1/3

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AB - We demonstrate terahertz (THz) imaging and spectroscopy of a 15 × 15-mm2 single-layer graphene film on Si using broadband THz pulses. The THz images clearly map out the THz carrier dynamics of the grapheneon-Si sample, allowing us to measure sheet conductivity with sub-mm resolution without fabricating electrodes. The THz carrier dynamics are dominated by intraband transitions and the THz-induced electron motion is characterized by a flat spectral response. A theoretical analysis based on the Fresnel coefficients for a metallic thin film shows that the local sheet conductivity varies across the sample from σs = 1.7 × 10--3 to 2.4 × 10 -3 Ω-1 (sheet resistance, ρs = 420 - 590 Ω/sq).

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Terahertz imaging and spectroscopy of largearea single-layer graphene

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