Terahertz imaging and spectroscopy of largearea single-layer graphene

J. L. Tomaino, A. D. Jameson, J. W. Kevek, M. J. Paul, A. M. Van Der Zande, R. A. Barton, P. L. McEuen, E. D. Minot, Yun Shik Lee

Research output: Contribution to journalArticlepeer-review

Abstract

We demonstrate terahertz (THz) imaging and spectroscopy of a 15 × 15-mm2 single-layer graphene film on Si using broadband THz pulses. The THz images clearly map out the THz carrier dynamics of the grapheneon-Si sample, allowing us to measure sheet conductivity with sub-mm resolution without fabricating electrodes. The THz carrier dynamics are dominated by intraband transitions and the THz-induced electron motion is characterized by a flat spectral response. A theoretical analysis based on the Fresnel coefficients for a metallic thin film shows that the local sheet conductivity varies across the sample from σs = 1.7 × 10--3 to 2.4 × 10 -3 Ω-1 (sheet resistance, ρs = 420 - 590 Ω/sq).

Original languageEnglish (US)
Pages (from-to)141-146
Number of pages6
JournalOptics Express
Volume19
Issue number1
DOIs
StatePublished - Jan 3 2011
Externally publishedYes

ASJC Scopus subject areas

  • Atomic and Molecular Physics, and Optics

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