Temperature profiles in ceramic cylinders produced by microwave and millimeter-wave heating

A. W. Fliflet, S. H. Gold, R. W. Bruce, D. Lewis

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

To investigate the internal temperature profiles produced in ceramic workpieces during microwave processing we analyze the heating of ceramic cylinders by a plane-wave RF beam for frequencies in the microwave and millimeter-wave regimes. The analysis includes the temperature dependence of the dielectric properties, an effect that can dramatically alter the microwave coupling during the heating process. To approximate the continuous variation of dielectric properties and temperatures, the cylinder was subdivided into thin tubular regions. The nonlinear heat conduction equation is solved by an iterative process.

Original languageEnglish (US)
Title of host publication2006 IEEE International Vacuum Electronics Conference held jointly with 2006 IEEE International Vacuum Electron Sources, IVEC/IVESC 2006
Pages385-386
Number of pages2
StatePublished - Dec 1 2006
Externally publishedYes
Event2006 IEEE International Vacuum Electronics Conference held jointly with 2006 IEEE International Vacuum Electron Sources, IVEC/IVESC 2006 - Monterey, CA, United States
Duration: Apr 25 2006Apr 27 2006

Publication series

Name2006 IEEE International Vacuum Electronics Conference held jointly with 2006 IEEE International Vacuum Electron Sources, IVEC/IVESC 2006

Conference

Conference2006 IEEE International Vacuum Electronics Conference held jointly with 2006 IEEE International Vacuum Electron Sources, IVEC/IVESC 2006
CountryUnited States
CityMonterey, CA
Period4/25/064/27/06

Keywords

  • Ceramics
  • Microwave processing
  • Millimeter-waves

ASJC Scopus subject areas

  • Electrical and Electronic Engineering

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  • Cite this

    Fliflet, A. W., Gold, S. H., Bruce, R. W., & Lewis, D. (2006). Temperature profiles in ceramic cylinders produced by microwave and millimeter-wave heating. In 2006 IEEE International Vacuum Electronics Conference held jointly with 2006 IEEE International Vacuum Electron Sources, IVEC/IVESC 2006 (pp. 385-386). [1666344] (2006 IEEE International Vacuum Electronics Conference held jointly with 2006 IEEE International Vacuum Electron Sources, IVEC/IVESC 2006).