Temperature dependence of surface phonon polaritons from a quartz grating

Andrew K. Hafeli, Eden Rephaeli, Shanhui Fan, David G. Cahill, Thomas E. Tiwald

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We report the temperature dependence of the surface phonon polariton (SPhP) spectra of α-SiO2 (quartz), propagated to the far-field by a grating, in the temperature range between 300 K and 800 K. Room temperature data for a 670 nm deep grating are compared to a simulated spectrum using a finite-difference frequency-domain approach. The inputs to the simulation are the dielectric functions measured by infrared ellipsometry and modeled as a set of damped oscillators. The simulated spectra are in good agreement with experiment. The width of the SPhP reflectivity dip depends on the depth of the grating. For a grating depth of 280 nm, the width of the reflectivity dip in the temperature range 300 < T < 800 K is comparable to what is expected for the SPhP excitations of a flat surface. For a grating depth of 670 nm, the width of the reflectivity dip increases significantly due to coupling to far-field radiation.

Original languageEnglish (US)
Article number043517
JournalJournal of Applied Physics
Issue number4
StatePublished - Aug 15 2011


ASJC Scopus subject areas

  • Physics and Astronomy(all)

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