We report the temperature dependence of the surface phonon polariton (SPhP) spectra of α-SiO2 (quartz), propagated to the far-field by a grating, in the temperature range between 300 K and 800 K. Room temperature data for a 670 nm deep grating are compared to a simulated spectrum using a finite-difference frequency-domain approach. The inputs to the simulation are the dielectric functions measured by infrared ellipsometry and modeled as a set of damped oscillators. The simulated spectra are in good agreement with experiment. The width of the SPhP reflectivity dip depends on the depth of the grating. For a grating depth of 280 nm, the width of the reflectivity dip in the temperature range 300 < T < 800 K is comparable to what is expected for the SPhP excitations of a flat surface. For a grating depth of 670 nm, the width of the reflectivity dip increases significantly due to coupling to far-field radiation.
|Original language||English (US)|
|Journal||Journal of Applied Physics|
|State||Published - Aug 15 2011|
ASJC Scopus subject areas
- Physics and Astronomy(all)