TEM study of Bi segregation in the interconnect of eutectic tin-bismuth solder and copper

P. J. Shang, Z. Q. Liu, L. Zhang, D. X. Li, J. K. Shang

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Fingerprint

Dive into the research topics of 'TEM study of Bi segregation in the interconnect of eutectic tin-bismuth solder and copper'. Together they form a unique fingerprint.

Keyphrases

Material Science