Skip to main navigation
Skip to search
Skip to main content
Illinois Experts Home
LOGIN & Help
Home
Profiles
Research units
Research & Scholarship
Datasets
Honors
Press/Media
Activities
Search by expertise, name or affiliation
TE Scattering by an Inhomogeneously Filled Aperture in a Thick Conducting Plane
Jian Ming Jin
, John L. Volakis
Research output
:
Contribution to journal
›
Article
›
peer-review
Overview
Fingerprint
Fingerprint
Dive into the research topics of 'TE Scattering by an Inhomogeneously Filled Aperture in a Thick Conducting Plane'. Together they form a unique fingerprint.
Sort by
Weight
Alphabetically
Engineering
Finite Element Method
100%
Composite Material
100%
Transmissions
100%
Numerical Example
100%
Fast Fourier Transform
100%
Conjugate Gradient Method
100%
Integral Method
100%
Electric Polarization
100%
Larger Aperture
100%
Keyphrases
Conducting Plane
100%
Transverse Electric
100%
Composite Materials
50%
Transmission Properties
50%
Finite Element
50%
Numerical Examples
50%
Scattering Properties
50%
Fast Fourier Transform
50%
Conjugate Gradient Method
50%
Boundary Integral Method
50%
Transverse Electric Polarization
50%
Large Aperture
50%
Finite Boundary
50%
Electromagnetic Characterization
50%
Method Fourier
50%
Physics
Electromagnetic
100%
Finite Element Method
100%
Boundary-Integral Method
100%
Composite Material
100%