Abstract
A new form of pattern referred to as a fully dependent pattern or d-pattern is provided. The d-pattern captures dependence among a set of items based on a dependency test. An efficient algorithm is provided for discovering all d-patterns in data. Specifically, a linear algorithm is provided for testing whether a pattern is an d-pattern. Further, a pruning algorithm is provided that prunes the search space effectively. Still further, a level-wise algorithm for mining d-patterns is provided.
| Original language | English (US) |
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| U.S. patent number | US6990486B2 |
| IPC | G06F 17/ 18 A I |
| Filing date | 8/15/01 |
| State | Published - Jan 24 2006 |
| Externally published | Yes |