Systems and methods for discovering fully dependent patterns

Feng Liang (Inventor), Sheng Ma (Inventor), Joseph L Hellerstein (Inventor)

Research output: Patent

Abstract

A new form of pattern referred to as a fully dependent pattern or d-pattern is provided. The d-pattern captures dependence among a set of items based on a dependency test. An efficient algorithm is provided for discovering all d-patterns in data. Specifically, a linear algorithm is provided for testing whether a pattern is an d-pattern. Further, a pruning algorithm is provided that prunes the search space effectively. Still further, a level-wise algorithm for mining d-patterns is provided.
Original languageEnglish (US)
Patent numberUS6990486B2
IPCG06F 17/ 18 A I
Filing date8/15/01
StatePublished - Jan 24 2006
Externally publishedYes

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