A new form of pattern referred to as a fully dependent pattern or d-pattern is provided. The d-pattern captures dependence among a set of items based on a dependency test. An efficient algorithm is provided for discovering all d-patterns in data. Specifically, a linear algorithm is provided for testing whether a pattern is an d-pattern. Further, a pruning algorithm is provided that prunes the search space effectively. Still further, a level-wise algorithm for mining d-patterns is provided.
|Original language||English (US)|
|U.S. patent number||US6990486B2|
|IPC||G06F 17/ 18 A I|
|State||Published - Jan 24 2006|