Systematic development of transmission-line models for interconnects with frequency-dependent losses

Karen M. Coperich; Jason Morsey; Vladimir I. Okhmatovski; Andreas C. Cangellaris; Albert E. Ruehli

doi:10.1109/22.954771

Systematic development of transmission-line models for interconnects with frequency-dependent losses

Karen M. Coperich, Jason Morsey, Vladimir I. Okhmatovski, Andreas C. Cangellaris, Albert E. Ruehli

Research output: Contribution to journal › Article › peer-review

Abstract

This paper presents a new method for the extraction of the frequency-dependent, per-unit-length (p.u.l.) resistance, and inductance parameters of multiconductor interconnects. The proposed extraction methodology is based on a new formulation of the magneto-quasi-static problem that allows lossy ground planes of finite thickness to be modeled rigorously. The formulation is such that the p.u.l. impedance matrix for the multiconductor interconnect is extracted directly at a prescribed frequency. Once the matrix has been calculated over the bandwidth of interest, rational function representations of its elements are generated through a robust matrix curve-fitting process. Such a formulation enables subsequent transient analysis of interconnects through a variety of approaches. Direct incorporation of the rational function model into a general-purpose circuit simulator and a standalone multiconductor-transmission-line simulator is demonstrated.

Original language	English (US)
Pages (from-to)	1677-1685
Number of pages	9
Journal	IEEE Transactions on Microwave Theory and Techniques
Volume	49
Issue number	10
DOIs	https://doi.org/10.1109/22.954771
State	Published - Oct 2001

Keywords

Broad-band transmission-line model
Closed-form electromagnetic Green's functions
Dispersion
Dispersive multiconductor interconnect model
Equivalent circuit
Finite-difference time-domain simulation
Frequency-dependent losses
Frequency-dependent per-unit-length impedance matrix
Frequency-dependent per-unit-length inductance parameters
Frequency-dependent per-unit-length resistance parameters
High-speed electrical interconnections
Lossy ground planes
Magneto-quasi-static problem
Method of moments
Multiconductor transmission lines
Ohmic losses
Parameter-extraction methodology
Planar inhomogeneous media
Proximity effect
Rational function representations
SPICE-compatible models
Skin effect
Telegrapher’s equations
Time-domain simulation
Transmission line
Vector curve fitting

ASJC Scopus subject areas

Radiation
Condensed Matter Physics
Electrical and Electronic Engineering

Online availability

10.1109/22.954771

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@article{06351201557e464bb9287e251ca0935c,

title = "Systematic development of transmission-line models for interconnects with frequency-dependent losses",

abstract = "This paper presents a new method for the extraction of the frequency-dependent, per-unit-length (p.u.l.) resistance, and inductance parameters of multiconductor interconnects. The proposed extraction methodology is based on a new formulation of the magneto-quasi-static problem that allows lossy ground planes of finite thickness to be modeled rigorously. The formulation is such that the p.u.l. impedance matrix for the multiconductor interconnect is extracted directly at a prescribed frequency. Once the matrix has been calculated over the bandwidth of interest, rational function representations of its elements are generated through a robust matrix curve-fitting process. Such a formulation enables subsequent transient analysis of interconnects through a variety of approaches. Direct incorporation of the rational function model into a general-purpose circuit simulator and a standalone multiconductor-transmission-line simulator is demonstrated.",

keywords = "Broad-band transmission-line model, Closed-form electromagnetic Green's functions, Dispersion, Dispersive multiconductor interconnect model, Equivalent circuit, Finite-difference time-domain simulation, Frequency-dependent losses, Frequency-dependent per-unit-length impedance matrix, Frequency-dependent per-unit-length inductance parameters, Frequency-dependent per-unit-length resistance parameters, High-speed electrical interconnections, Lossy ground planes, Magneto-quasi-static problem, Method of moments, Multiconductor transmission lines, Ohmic losses, Parameter-extraction methodology, Planar inhomogeneous media, Proximity effect, Rational function representations, SPICE-compatible models, Skin effect, Telegrapher{\textquoteright}s equations, Time-domain simulation, Transmission line, Vector curve fitting",

author = "Coperich, {Karen M.} and Jason Morsey and Okhmatovski, {Vladimir I.} and Cangellaris, {Andreas C.} and Ruehli, {Albert E.}",

note = "Funding Information: Manuscript received January 15, 2001. This work was supported in part by the Semiconductor Research Corporation under Contract 98-DJ-611 and by an IBM Faculty Partnership Award. The work of K. M. Coperich was supported under a Scientific Research Council Graduate Fellowship.",

year = "2001",

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AU - Okhmatovski, Vladimir I.

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AU - Ruehli, Albert E.

N1 - Funding Information: Manuscript received January 15, 2001. This work was supported in part by the Semiconductor Research Corporation under Contract 98-DJ-611 and by an IBM Faculty Partnership Award. The work of K. M. Coperich was supported under a Scientific Research Council Graduate Fellowship.

PY - 2001/10

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N2 - This paper presents a new method for the extraction of the frequency-dependent, per-unit-length (p.u.l.) resistance, and inductance parameters of multiconductor interconnects. The proposed extraction methodology is based on a new formulation of the magneto-quasi-static problem that allows lossy ground planes of finite thickness to be modeled rigorously. The formulation is such that the p.u.l. impedance matrix for the multiconductor interconnect is extracted directly at a prescribed frequency. Once the matrix has been calculated over the bandwidth of interest, rational function representations of its elements are generated through a robust matrix curve-fitting process. Such a formulation enables subsequent transient analysis of interconnects through a variety of approaches. Direct incorporation of the rational function model into a general-purpose circuit simulator and a standalone multiconductor-transmission-line simulator is demonstrated.

AB - This paper presents a new method for the extraction of the frequency-dependent, per-unit-length (p.u.l.) resistance, and inductance parameters of multiconductor interconnects. The proposed extraction methodology is based on a new formulation of the magneto-quasi-static problem that allows lossy ground planes of finite thickness to be modeled rigorously. The formulation is such that the p.u.l. impedance matrix for the multiconductor interconnect is extracted directly at a prescribed frequency. Once the matrix has been calculated over the bandwidth of interest, rational function representations of its elements are generated through a robust matrix curve-fitting process. Such a formulation enables subsequent transient analysis of interconnects through a variety of approaches. Direct incorporation of the rational function model into a general-purpose circuit simulator and a standalone multiconductor-transmission-line simulator is demonstrated.

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Systematic development of transmission-line models for interconnects with frequency-dependent losses

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