Synchrotron-based imaging and tomography with hard X-rays

C. Rau, V. Crecea, W. Liu, C. P. Richter, K. M. Peterson, P. R. Jemian, U. Neuhäusler, G. Schneider, X. Yu, P. V. Braun, T. C. Chiang, I. K. Robinson

Research output: Contribution to journalArticlepeer-review


Hard X-ray imaging with synchrotron radiation is a powerful tool to study opaque materials on the micro- and nano-lengthscales. Different imaging methods are available with an instrument recently built at Sector 34 of the Advanced Photon Source. In-line phase contrast imaging is performed with micrometer resolution. Increased spatial resolution is achieved using cone-beam geometry. The almost parallel beam is focused with a Kirkpatrick-Baez mirror system. The focal spot serves as a diverging secondary source. An X-ray magnified image of the sample is projected on the detector. For imaging and tomography with sub-100 nm resolution, an X-ray full-field microscope has been built. It uses a Kirkpatrick-Baez mirror (KB) as a condenser optic, followed by a micro-Fresnel zone plate (FZP) as an objective lens. The zone plates presently provide 50-85 nm spatial resolution when operating the microscope with photon energy between 6 and 12 keV. Tomography experiments have been performed with this new device.

Original languageEnglish (US)
Pages (from-to)850-854
Number of pages5
JournalNuclear Instruments and Methods in Physics Research, Section B: Beam Interactions with Materials and Atoms
Issue number1-2 SPEC. ISS.
StatePublished - Aug 2007


  • Cone-beam imaging
  • Hard X-ray microscopy
  • In-line phase contrast
  • Synchrotron radiation
  • Tomography

ASJC Scopus subject areas

  • Surfaces, Coatings and Films
  • Instrumentation
  • Surfaces and Interfaces


Dive into the research topics of 'Synchrotron-based imaging and tomography with hard X-rays'. Together they form a unique fingerprint.

Cite this