Surface normal reconstruction using circularly polarized light

N. Missael Garcia, Ignacio De Erausquin, Christopher Edmiston, Viktor Gruev

Research output: Contribution to journalArticlepeer-review

Abstract

The polarization properties of reflected light capture important information about the object's inherent properties: material composition, i.e. index of refraction and scattering properties, and shape of the object, i.e. surface normal. Polarization information therefore has been used for surface reconstruction using a single-view camera with unpolarized incident light. However, this surface normal reconstruction technique suffers from a zenith angle ambiguity. In this paper, we have utilized circularly polarized light to solve for the zenith ambiguity by developing a detailed model using Mueller matrix formulism and division of focal plane polarization imaging technology. Experiment results validate our model for accurate surface reconstruction.

Original languageEnglish (US)
Pages (from-to)14391-14406
Number of pages16
JournalOptics Express
Volume23
Issue number11
DOIs
StatePublished - Jun 1 2015
Externally publishedYes

ASJC Scopus subject areas

  • Atomic and Molecular Physics, and Optics

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