TY - JOUR
T1 - Surface normal reconstruction using circularly polarized light
AU - Garcia, N. Missael
AU - De Erausquin, Ignacio
AU - Edmiston, Christopher
AU - Gruev, Viktor
N1 - Publisher Copyright:
© 2015 Optical Society of America.
PY - 2015/6/1
Y1 - 2015/6/1
N2 - The polarization properties of reflected light capture important information about the object's inherent properties: material composition, i.e. index of refraction and scattering properties, and shape of the object, i.e. surface normal. Polarization information therefore has been used for surface reconstruction using a single-view camera with unpolarized incident light. However, this surface normal reconstruction technique suffers from a zenith angle ambiguity. In this paper, we have utilized circularly polarized light to solve for the zenith ambiguity by developing a detailed model using Mueller matrix formulism and division of focal plane polarization imaging technology. Experiment results validate our model for accurate surface reconstruction.
AB - The polarization properties of reflected light capture important information about the object's inherent properties: material composition, i.e. index of refraction and scattering properties, and shape of the object, i.e. surface normal. Polarization information therefore has been used for surface reconstruction using a single-view camera with unpolarized incident light. However, this surface normal reconstruction technique suffers from a zenith angle ambiguity. In this paper, we have utilized circularly polarized light to solve for the zenith ambiguity by developing a detailed model using Mueller matrix formulism and division of focal plane polarization imaging technology. Experiment results validate our model for accurate surface reconstruction.
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U2 - 10.1364/OE.23.014391
DO - 10.1364/OE.23.014391
M3 - Article
AN - SCOPUS:84943164973
SN - 1094-4087
VL - 23
SP - 14391
EP - 14406
JO - Optics Express
JF - Optics Express
IS - 11
ER -