Abstract
Scanning tunneling microscopy is used to characterize the surface of homoepitaxial GaAs(001) films deposited on GaAs(001) substrates miscut 0.2° towards [110]. Films are grown using solid-source (As4) and gas-source (AsH3) arsenic at temperatures ranging from 500 to 650̊C. The surface morphology of GaAs(001) is found to be extremely sensitive to growth temperature - for both solid-and gas-source molecular beam epitaxially grown films. Further, the presence of arsenic hydrides (hydrogen) reduces the surface roughness in the multilayer growth mode.
Original language | English (US) |
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Pages (from-to) | 136-144 |
Number of pages | 9 |
Journal | Surface Science |
Volume | 346 |
Issue number | 1-3 |
DOIs | |
State | Published - Feb 1 1996 |
Keywords
- Gallium arsenide
- Growth
- Low index single crystal surfaces
- Molecular beam epitaxy
- Scanning tunneling microscopy
- Surface structure, morphology, roughness, and topography
ASJC Scopus subject areas
- Physical and Theoretical Chemistry
- Condensed Matter Physics
- Surfaces and Interfaces