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Surface mass diffusion and step stiffness on V(011)
M. Ondrejcek
, M. Rajappan
, W. Swiech
, C. P. Flynn
National Center for Supercomputing Applications (NCSA)
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Physics
Electron Microscopy
100%
Melting Point
100%
Temperature Dependence
100%
Thin Films
100%
Mathematics
Exp
100%
Melting Point
100%
Temperature Range
100%
Material Science
Low-Energy Electron Microscopy
100%
Thin Films
100%
Keyphrases
Fluctuation Experiment
50%