Abstract
By using gating technique, surface leakage generated by SiO2 passivation in long-wavelength infrared type-II superlattice photodetector is suppressed, and different surface leakage mechanisms are disclosed. By reducing the SiO2 passivation layer thickness, the saturated gated bias is reduced to -4.5 V. At 77 K, dark current densities of gated devices are reduced by more than 2 orders of magnitude, with 3071 Ω cm2 differential-resistance-area product at -100 mV. With quantum efficiency of 50, the 11μm 50 cut-off gated photodiode has a specific detectivity of 7 × 1011 Jones, and the detectivity stays above 2 × 1011 Jones from 0 to -500 mV operation bias.
Original language | English (US) |
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Article number | 213501 |
Journal | Applied Physics Letters |
Volume | 101 |
Issue number | 21 |
DOIs | |
State | Published - Nov 19 2012 |
Externally published | Yes |
ASJC Scopus subject areas
- Physics and Astronomy (miscellaneous)