Abstract
We obtain parameters for self-diffusion on the amorphous silicon surface by reanalyzing kinetic data for the formation of hemispherical grained silicon (HSG) previously published by another laboratory [J. Vac. Sci. Technol. A11 (1993) 2950]. Our mathematical model for individual HSG grain growth permits extraction of diffusivities for overall mass transport, and to our knowledge yields the first numbers for temperature-dependent self-diffusion on any amorphous surface. The activation energy for mass transfer diffusion is lower than that previously measured for crystalline Si(111).
Original language | English (US) |
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Pages (from-to) | L761-L766 |
Journal | Surface Science |
Volume | 494 |
Issue number | 1 |
DOIs | |
State | Published - Nov 10 2001 |
Keywords
- Amorphous surfaces
- Computer simulations
- Diffusion and migration
- Models of surface kinetics
- Silicon
- Surface diffusion
ASJC Scopus subject areas
- Condensed Matter Physics
- Surfaces and Interfaces
- Surfaces, Coatings and Films
- Materials Chemistry