Abstract
Initial synthesis of semiconducting oxides leaves behind poorly controlled concentrations of unwanted atomic-scale defects that influence numerous electrical, optical, and reactivity properties. We have discovered through self-diffusion measurements and first-principles computations that poison-free oxide surfaces inject interstitial oxygen atoms into the crystalline solid when simply contacted with liquid water near room temperature. These interstitials diffuse quickly to depths of 20 nm−2 μm and are likely to eliminate prominent classes of unwanted defects or neutralize their action. The mild conditions of operation access a regime for oxide fabrication that relaxes important thermodynamic constraints that hamper defect regulation by conventional methods at higher temperatures. The surface-based approach appears well-suited for use with nanoparticles, porous oxides, and thin films for applications in advanced electronics, renewable energy storage, photocatalysis, and photoelectrochemistry.
Original language | English (US) |
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Pages (from-to) | 34059-34068 |
Number of pages | 10 |
Journal | ACS Applied Materials and Interfaces |
Volume | 14 |
Issue number | 29 |
DOIs | |
State | Published - 2022 |
Keywords
- GaO
- TiO
- ZnO
- defects
- interstitials
- metal oxides
- oxygen
- vacancies
ASJC Scopus subject areas
- General Materials Science