Surface atomic diffusion processes observed at milliseconds time resolution using environmental TEM

Wenpei Gao; Jianbo Wu; Xiaofeng Zhang; Aram Yoon; J. Mabon; W. Swiech; W. L. Wilson; H. Yang; Jian Min Zuo

doi:10.1017/S1431927614009684

Surface atomic diffusion processes observed at milliseconds time resolution using environmental TEM

Wenpei Gao
, Jianbo Wu
, Xiaofeng Zhang
, Aram Yoon
, J. Mabon
, W. Swiech
, W. L. Wilson
, H. Yang
, Jian Min Zuo

Research output: Contribution to journal › Conference article › peer-review

Original language	English (US)
Pages (from-to)	1590-1591
Number of pages	2
Journal	Microscopy and Microanalysis
Volume	20
Issue number	3
DOIs	https://doi.org/10.1017/S1431927614009684
State	Published - Aug 1 2014
Event	Microscopy and Microanalysis 2014, M and M 2014 - Hartford, United States Duration: Aug 3 2014 → Aug 7 2014

ASJC Scopus subject areas

Instrumentation

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10.1017/S1431927614009684

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@article{a7aa889624d14f60bb5ecc14feaf4a2b,

title = "Surface atomic diffusion processes observed at milliseconds time resolution using environmental TEM",

author = "Wenpei Gao and Jianbo Wu and Xiaofeng Zhang and Aram Yoon and J. Mabon and W. Swiech and Wilson, \{W. L.\} and H. Yang and Zuo, \{Jian Min\}",

year = "2014",

month = aug,

day = "1",

doi = "10.1017/S1431927614009684",

language = "English (US)",

volume = "20",

pages = "1590--1591",

journal = "Microscopy and Microanalysis",

issn = "1431-9276",

publisher = "Oxford University Press",

number = "3",

note = "Microscopy and Microanalysis 2014, M and M 2014 ; Conference date: 03-08-2014 Through 07-08-2014",

}

TY - JOUR

T1 - Surface atomic diffusion processes observed at milliseconds time resolution using environmental TEM

AU - Gao, Wenpei

AU - Wu, Jianbo

AU - Zhang, Xiaofeng

AU - Yoon, Aram

AU - Mabon, J.

AU - Swiech, W.

AU - Wilson, W. L.

AU - Yang, H.

AU - Zuo, Jian Min

PY - 2014/8/1

Y1 - 2014/8/1

UR - https://www.scopus.com/pages/publications/84927936425

UR - https://www.scopus.com/pages/publications/84927936425#tab=citedBy

U2 - 10.1017/S1431927614009684

DO - 10.1017/S1431927614009684

M3 - Conference article

AN - SCOPUS:84927936425

SN - 1431-9276

VL - 20

SP - 1590

EP - 1591

JO - Microscopy and Microanalysis

JF - Microscopy and Microanalysis

IS - 3

T2 - Microscopy and Microanalysis 2014, M and M 2014

Y2 - 3 August 2014 through 7 August 2014

ER -

Surface atomic diffusion processes observed at milliseconds time resolution using environmental TEM

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