Superstructure in thin films of bi-based compounds on mgo

Kazuyoshi Kojima, Masami Tanioku, Koichi Hamanaka, James S. Harris, Darrell G. Schlom, Ken'ichi Kuroda, James N. Eckstein

Research output: Contribution to journalArticlepeer-review


In situ epitaxial growth of BiSrCaCuO films by three target sputtering was performed on MgO substrates at a temperature of 650°C. From high resolution transmission electron microscopy, the film showed a superstructure consisting of the alternate stacking of the low-Tc and high-Tc phases with a c-axis of 34 A. The film in the [110] or [11̄0] directions was parallel to <100>MgO, and the transient layers between the substrate and the film were less than a few atomic layers thick. X-ray diffraction simulations indicated that the films contained random layer ordering of 34 A bi-layers (low-Tc + high-Tc and high-Tc + low-Tc) and random layer ordering of low-Tc and high-Tc phase layers.

Original languageEnglish (US)
Pages (from-to)L1638-L1641
JournalJapanese Journal of Applied Physics
Issue number9
StatePublished - Sep 1990
Externally publishedYes


  • BiSrCaCuO
  • Sputtering
  • Superconductor
  • Superlattice
  • Thin film
  • Transmission electron microscopy

ASJC Scopus subject areas

  • General Engineering
  • General Physics and Astronomy


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