In situ epitaxial growth of BiSrCaCuO films by three target sputtering was performed on MgO substrates at a temperature of 650°C. From high resolution transmission electron microscopy, the film showed a superstructure consisting of the alternate stacking of the low-Tc and high-Tc phases with a c-axis of 34 A. The film in the  or [11̄0] directions was parallel to <100>MgO, and the transient layers between the substrate and the film were less than a few atomic layers thick. X-ray diffraction simulations indicated that the films contained random layer ordering of 34 A bi-layers (low-Tc + high-Tc and high-Tc + low-Tc) and random layer ordering of low-Tc and high-Tc phase layers.
- Thin film
- Transmission electron microscopy
ASJC Scopus subject areas
- Physics and Astronomy(all)