Abstract
We analyze the evolution of the normal and superconducting properties of epitaxial TiN films, characterized by high Ioffe-Regel parameter values, as a function of the film thickness. As the film thickness decreases, we observe an increase of the residual resistivity, that becomes dominated by diffusive surface scattering for d≤20nm. At the same time, a substantial thickness-dependent reduction of the superconducting critical temperature is observed compared to the bulk TiN value. In such high-quality material films, this effect can be explained by a weak magnetic disorder residing in the surface layer with a characteristic magnetic defect density of approximately 1012cm-2. Our results suggest that surface magnetic disorder is generally present in oxidized TiN films.
Original language | English (US) |
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Article number | 054001 |
Journal | Physical Review Applied |
Volume | 12 |
Issue number | 5 |
DOIs | |
State | Published - Nov 1 2019 |
Externally published | Yes |
ASJC Scopus subject areas
- General Physics and Astronomy