Super-resolution imaging of nanostructures by solving the phase problem with over-sampling of diffraction patterns

J. M. Zuo, I. Vartanyants, M. Gao, L. A. Nagahara, R. Zhang

Research output: Contribution to journalArticlepeer-review

Original languageEnglish (US)
Pages (from-to)942-943
Number of pages2
JournalMicroscopy and Microanalysis
Issue numberSUPPL. 2
StatePublished - 2003

ASJC Scopus subject areas

  • Instrumentation

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