Abstract
In this paper we describe a set of algorithms for handling substrate-coupled switching noise in an iterative placement framework. Our model for switching noise uses a coarse resistive grid method for analyzing the coupling of digital switching noise into the analog macros on the chip. The noise effects determined through these models are incorporated into a constrained, simulated annealing based macro cell placement flow. Our results indicate that these substrate-aware algorithms support efficient mixed-signal placement optimization.
| Original language | English (US) |
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| Title of host publication | Proceedings of the Custom Integrated Circuits Conference |
| Editors | Anon |
| Publisher | Publ by IEEE |
| Pages | 529-532 |
| Number of pages | 4 |
| ISBN (Print) | 0780318870 |
| State | Published - 1994 |
| Externally published | Yes |
| Event | Proceedings of the IEEE 1994 Custom Integrated Circuits Conference - San Diego, CA, USA Duration: May 1 1994 → May 4 1994 |
Other
| Other | Proceedings of the IEEE 1994 Custom Integrated Circuits Conference |
|---|---|
| City | San Diego, CA, USA |
| Period | 5/1/94 → 5/4/94 |
ASJC Scopus subject areas
- Electrical and Electronic Engineering