Abstract
In this paper we describe a set of algorithms for handling substrate-coupled switching noise in an iterative placement framework. Our model for switching noise uses a coarse resistive grid method for analyzing the coupling of digital switching noise into the analog macros on the chip. The noise effects determined through these models are incorporated into a constrained, simulated annealing based macro cell placement flow. Our results indicate that these substrate-aware algorithms support efficient mixed-signal placement optimization.
Original language | English (US) |
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Title of host publication | Proceedings of the Custom Integrated Circuits Conference |
Editors | Anon |
Publisher | Publ by IEEE |
Pages | 529-532 |
Number of pages | 4 |
ISBN (Print) | 0780318870 |
State | Published - 1994 |
Externally published | Yes |
Event | Proceedings of the IEEE 1994 Custom Integrated Circuits Conference - San Diego, CA, USA Duration: May 1 1994 → May 4 1994 |
Other
Other | Proceedings of the IEEE 1994 Custom Integrated Circuits Conference |
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City | San Diego, CA, USA |
Period | 5/1/94 → 5/4/94 |
ASJC Scopus subject areas
- Electrical and Electronic Engineering