Submicron particle removal

Martin J Neumann (Inventor), David N Ruzic (Inventor), Brian E Jurczyk (Inventor), Huatan Qiu (Inventor), Darren Alman (Inventor)

Research output: Patent

Abstract

A system for non-contact cleaning of particulate contamination of surfaces includes one or more sources that create a charge imbalance between a surface and particles that contaminate the surface, and a power supply that creates a pulsed electrical bias on the surface. This imbalance produces an electrostatic force that propels the particles off the surface. The cleaning process can be associated, for example, with microelectronic lithography and manufacturing.
Original languageEnglish (US)
U.S. patent number7528386
StatePublished - May 5 2009

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