Strong tip effects in near-field scanning optical tomography

Jin Sun; P. Scott Carney; John C. Schotland

doi:10.1063/1.2812545

Strong tip effects in near-field scanning optical tomography

Jin Sun
, P. Scott Carney
, John C. Schotland

Research output: Contribution to journal › Article › peer-review

Abstract

A model for the interaction of the scanning probe in near-field scanning optical microscopy is presented. Multiple scattering of the illuminating field with the probe is taken into account. The implications of this so-called strong tip model for the solution of the associated inverse scattering problem are studied through simulations.

Original language	English (US)
Article number	103103
Journal	Journal of Applied Physics
Volume	102
Issue number	10
DOIs	https://doi.org/10.1063/1.2812545
State	Published - 2007
Externally published	Yes

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General Physics and Astronomy

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10.1063/1.2812545

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title = "Strong tip effects in near-field scanning optical tomography",

abstract = "A model for the interaction of the scanning probe in near-field scanning optical microscopy is presented. Multiple scattering of the illuminating field with the probe is taken into account. The implications of this so-called strong tip model for the solution of the associated inverse scattering problem are studied through simulations.",

author = "Jin Sun and Carney, \{P. Scott\} and Schotland, \{John C.\}",

note = "This work was supported in part by U.S. Air Force MURI Grant F49620-03-10379 and in part by the National Science Foundation under CAREER Award Grant 0239265 and a University of Illinois Urbana-Champaign Critical Initiatives in Research and Scholarship grant. J.C.S. acknowledges support under Grant Nos. NSF DMR 0425780 and USAFOSR FA9550-07-1- 0096.",

year = "2007",

doi = "10.1063/1.2812545",

language = "English (US)",

volume = "102",

journal = "Journal of Applied Physics",

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AU - Sun, Jin

AU - Carney, P. Scott

AU - Schotland, John C.

N1 - This work was supported in part by U.S. Air Force MURI Grant F49620-03-10379 and in part by the National Science Foundation under CAREER Award Grant 0239265 and a University of Illinois Urbana-Champaign Critical Initiatives in Research and Scholarship grant. J.C.S. acknowledges support under Grant Nos. NSF DMR 0425780 and USAFOSR FA9550-07-1- 0096.

PY - 2007

Y1 - 2007

N2 - A model for the interaction of the scanning probe in near-field scanning optical microscopy is presented. Multiple scattering of the illuminating field with the probe is taken into account. The implications of this so-called strong tip model for the solution of the associated inverse scattering problem are studied through simulations.

AB - A model for the interaction of the scanning probe in near-field scanning optical microscopy is presented. Multiple scattering of the illuminating field with the probe is taken into account. The implications of this so-called strong tip model for the solution of the associated inverse scattering problem are studied through simulations.

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VL - 102

JO - Journal of Applied Physics

JF - Journal of Applied Physics

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M1 - 103103

ER -

Strong tip effects in near-field scanning optical tomography

Abstract

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