The invention provides a stress micro mechanical system for measuring stress and strain in micro- and nano-fibers tubes, and wires as well as for measuring the interface adhesion force and stress in nanofibers and nanotubes embedded in a polymer matrix. A preferred system of the invention has a substrate for supporting a MEMS fabrication. The MEMS fabrication includes freestanding sample attachment points that are movable in a translation direction relative to one another when the substrate is moved and a sample is attached between the sample attachment points. An optical microscope images surfaces of the MEMS fabrication. Software conducts digital image correlation on obtained images to determine the movement of the surfaces at a resolution much greater than the hardware resolution of the optical microscope. A preferred method for measuring stress and strain in micro- and nano-fibers, tubes, and wires, and/or measuring the force required to pull-out individual micro- and nano-fibers, tubes, and wires from a polymer matrix and to therefore measure interfacial adhesion is also provided. In the method a sample is attached between freestanding platforms in a MEMS device. Relative translational movement between the platforms is created and motion of the platforms is imaged with an optical microscope. Mechanical and adhesion properties of the sample are determined by applying a digital image correlation algorithm to the image data.
|Original language||English (US)|
|U.S. patent number||8499645|
|State||Published - Aug 6 2013|