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Stress evolution to steady state in ion bombardment of silicon
Nagarajan Kalyanasundaram
, Molly Wood
,
Jonathan B. Freund
,
H. T. Johnson
Aerospace Engineering
Mechanical Science and Engineering
Coordinated Science Lab
National Center for Supercomputing Applications (NCSA)
Materials Science and Engineering
Materials Research Lab
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Keyphrases
Stress Evolution
100%
Ion Bombardment
100%
Steady State
100%
Low Temperature
50%
Argon Atom
50%
Crystal Defects
50%
Ion Beam Current
50%
Argon Implantation
50%
Atomic Force
50%
Nanometre
50%
Engineering
Ion Implantation
100%
Low-Temperature
50%
Nanometre
50%
Beam Energy
50%
Constant Value
50%