Stochastic LIM for transient simulation of circuits with uncertainties

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

This paper presents a stochastic Latency Insertion Method formulation using the generalized Polynomial Chaos framework. The proposed method enables fast simulation of circuits with uncertain elements. When the mean and variance of circuit elements are provided in the netlist, this method can calculate the statistics of the transient response to arbitrary sources using an augmented state space system. Due to the underlying leapfrogging finite difference scheme, the computational complexity grows only linearly with the number of terms in the expansion. The formulation is verified using Monte Carlo on a random resistor network with inserted latencies.

Original languageEnglish (US)
Title of host publication2014 IEEE 23rd Conference on Electrical Performance of Electronic Packaging and Systems, EPEPS 2014
PublisherInstitute of Electrical and Electronics Engineers Inc.
Pages29-32
Number of pages4
ISBN (Electronic)9781479936410
DOIs
StatePublished - May 7 2015
Event23rd IEEE Conference on Electrical Performance of Electronic Packaging and Systems, EPEPS 2014 - Portland, United States
Duration: Oct 26 2014Oct 29 2014

Publication series

Name2014 IEEE 23rd Conference on Electrical Performance of Electronic Packaging and Systems, EPEPS 2014

Other

Other23rd IEEE Conference on Electrical Performance of Electronic Packaging and Systems, EPEPS 2014
CountryUnited States
CityPortland
Period10/26/1410/29/14

ASJC Scopus subject areas

  • Hardware and Architecture
  • Electrical and Electronic Engineering

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    Chen, X., Qiu, M., Schutt-Ainé, J. E., & Cangellaris, A. C. (2015). Stochastic LIM for transient simulation of circuits with uncertainties. In 2014 IEEE 23rd Conference on Electrical Performance of Electronic Packaging and Systems, EPEPS 2014 (pp. 29-32). [7103585] (2014 IEEE 23rd Conference on Electrical Performance of Electronic Packaging and Systems, EPEPS 2014). Institute of Electrical and Electronics Engineers Inc.. https://doi.org/10.1109/EPEPS.2014.7103585