Stochastic LIM for transient simulation of circuits with uncertainties

Xu Chen; Michael Qiu; José E. Schutt-Ainé; Andreas C. Cangellaris

doi:10.1109/EPEPS.2014.7103585

Stochastic LIM for transient simulation of circuits with uncertainties

Xu Chen, Michael Qiu, José E. Schutt-Ainé, Andreas C. Cangellaris

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

Abstract

This paper presents a stochastic Latency Insertion Method formulation using the generalized Polynomial Chaos framework. The proposed method enables fast simulation of circuits with uncertain elements. When the mean and variance of circuit elements are provided in the netlist, this method can calculate the statistics of the transient response to arbitrary sources using an augmented state space system. Due to the underlying leapfrogging finite difference scheme, the computational complexity grows only linearly with the number of terms in the expansion. The formulation is verified using Monte Carlo on a random resistor network with inserted latencies.

Original language	English (US)
Title of host publication	2014 IEEE 23rd Conference on Electrical Performance of Electronic Packaging and Systems, EPEPS 2014
Publisher	Institute of Electrical and Electronics Engineers Inc.
Pages	29-32
Number of pages	4
ISBN (Electronic)	9781479936410
DOIs	https://doi.org/10.1109/EPEPS.2014.7103585
State	Published - 2014
Event	23rd IEEE Conference on Electrical Performance of Electronic Packaging and Systems, EPEPS 2014 - Portland, United States Duration: Oct 26 2014 → Oct 29 2014

Publication series

Name	2014 IEEE 23rd Conference on Electrical Performance of Electronic Packaging and Systems, EPEPS 2014

Other

Other	23rd IEEE Conference on Electrical Performance of Electronic Packaging and Systems, EPEPS 2014
Country/Territory	United States
City	Portland
Period	10/26/14 → 10/29/14

ASJC Scopus subject areas

Hardware and Architecture
Electrical and Electronic Engineering

Online availability

10.1109/EPEPS.2014.7103585

Library availability

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Chen, X., Qiu, M., Schutt-Ainé, J. E., & Cangellaris, A. C. (2014). Stochastic LIM for transient simulation of circuits with uncertainties. In 2014 IEEE 23rd Conference on Electrical Performance of Electronic Packaging and Systems, EPEPS 2014 (pp. 29-32). Article 7103585 (2014 IEEE 23rd Conference on Electrical Performance of Electronic Packaging and Systems, EPEPS 2014). Institute of Electrical and Electronics Engineers Inc.. https://doi.org/10.1109/EPEPS.2014.7103585

Stochastic LIM for transient simulation of circuits with uncertainties. / Chen, Xu; Qiu, Michael; Schutt-Ainé, José E. et al.
2014 IEEE 23rd Conference on Electrical Performance of Electronic Packaging and Systems, EPEPS 2014. Institute of Electrical and Electronics Engineers Inc., 2014. p. 29-32 7103585 (2014 IEEE 23rd Conference on Electrical Performance of Electronic Packaging and Systems, EPEPS 2014).

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

Chen, X, Qiu, M, Schutt-Ainé, JE & Cangellaris, AC 2014, Stochastic LIM for transient simulation of circuits with uncertainties. in 2014 IEEE 23rd Conference on Electrical Performance of Electronic Packaging and Systems, EPEPS 2014., 7103585, 2014 IEEE 23rd Conference on Electrical Performance of Electronic Packaging and Systems, EPEPS 2014, Institute of Electrical and Electronics Engineers Inc., pp. 29-32, 23rd IEEE Conference on Electrical Performance of Electronic Packaging and Systems, EPEPS 2014, Portland, United States, 10/26/14. https://doi.org/10.1109/EPEPS.2014.7103585

Chen X, Qiu M, Schutt-Ainé JE , Cangellaris AC. Stochastic LIM for transient simulation of circuits with uncertainties. In 2014 IEEE 23rd Conference on Electrical Performance of Electronic Packaging and Systems, EPEPS 2014. Institute of Electrical and Electronics Engineers Inc. 2014. p. 29-32. 7103585. (2014 IEEE 23rd Conference on Electrical Performance of Electronic Packaging and Systems, EPEPS 2014). doi: 10.1109/EPEPS.2014.7103585

Chen, Xu ; Qiu, Michael ; Schutt-Ainé, José E. et al. / Stochastic LIM for transient simulation of circuits with uncertainties. 2014 IEEE 23rd Conference on Electrical Performance of Electronic Packaging and Systems, EPEPS 2014. Institute of Electrical and Electronics Engineers Inc., 2014. pp. 29-32 (2014 IEEE 23rd Conference on Electrical Performance of Electronic Packaging and Systems, EPEPS 2014).

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abstract = "This paper presents a stochastic Latency Insertion Method formulation using the generalized Polynomial Chaos framework. The proposed method enables fast simulation of circuits with uncertain elements. When the mean and variance of circuit elements are provided in the netlist, this method can calculate the statistics of the transient response to arbitrary sources using an augmented state space system. Due to the underlying leapfrogging finite difference scheme, the computational complexity grows only linearly with the number of terms in the expansion. The formulation is verified using Monte Carlo on a random resistor network with inserted latencies.",

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AB - This paper presents a stochastic Latency Insertion Method formulation using the generalized Polynomial Chaos framework. The proposed method enables fast simulation of circuits with uncertain elements. When the mean and variance of circuit elements are provided in the netlist, this method can calculate the statistics of the transient response to arbitrary sources using an augmented state space system. Due to the underlying leapfrogging finite difference scheme, the computational complexity grows only linearly with the number of terms in the expansion. The formulation is verified using Monte Carlo on a random resistor network with inserted latencies.

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Stochastic LIM for transient simulation of circuits with uncertainties

Abstract

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