TY - GEN
T1 - Stochastic electromagnetic-circuit simulation for system-level EMI analysis
AU - Ma, Xiao
AU - Chen, Xu
AU - Rong, Aosheng
AU - Schutt-Aine, Jose E.
AU - Cangellaris, Andreas C.
N1 - Publisher Copyright:
© 2017 IEEE.
PY - 2017/10/20
Y1 - 2017/10/20
N2 - A stochastic electromagnetic-circuit modeling workflow is presented for the computer-aided analysis of electromagnetic interference effects in multi-scale, shielded environments. The multi-scale complexity of the environment is tackled through the selective relaxation of the full electromagnetic coupling between different sub-domains when appropriate. The Stochastic Collocation technique is relied upon for the sampling of the random space. The proposed methodology is demonstrated through its application to the modeling of radiated noise coupling to a High Speed Link circuit inside a partially shielded metallic enclosure.
AB - A stochastic electromagnetic-circuit modeling workflow is presented for the computer-aided analysis of electromagnetic interference effects in multi-scale, shielded environments. The multi-scale complexity of the environment is tackled through the selective relaxation of the full electromagnetic coupling between different sub-domains when appropriate. The Stochastic Collocation technique is relied upon for the sampling of the random space. The proposed methodology is demonstrated through its application to the modeling of radiated noise coupling to a High Speed Link circuit inside a partially shielded metallic enclosure.
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U2 - 10.1109/ISEMC.2017.8077852
DO - 10.1109/ISEMC.2017.8077852
M3 - Conference contribution
AN - SCOPUS:85039167122
T3 - IEEE International Symposium on Electromagnetic Compatibility
SP - 118
EP - 123
BT - 2017 IEEE International Symposium on Electromagnetic Compatibility, Signal and Power Integrity, EMCSI 2017 - Proceedings
PB - Institute of Electrical and Electronics Engineers Inc.
T2 - 2017 IEEE International Symposium on Electromagnetic Compatibility, Signal and Power Integrity, EMCSI 2017
Y2 - 7 August 2017 through 11 August 2017
ER -