Stochastic electromagnetic-circuit simulation for system-level EMI analysis

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

A stochastic electromagnetic-circuit modeling workflow is presented for the computer-aided analysis of electromagnetic interference effects in multi-scale, shielded environments. The multi-scale complexity of the environment is tackled through the selective relaxation of the full electromagnetic coupling between different sub-domains when appropriate. The Stochastic Collocation technique is relied upon for the sampling of the random space. The proposed methodology is demonstrated through its application to the modeling of radiated noise coupling to a High Speed Link circuit inside a partially shielded metallic enclosure.

Original languageEnglish (US)
Title of host publication2017 IEEE International Symposium on Electromagnetic Compatibility, Signal and Power Integrity, EMCSI 2017 - Proceedings
PublisherInstitute of Electrical and Electronics Engineers Inc.
Pages118-123
Number of pages6
ISBN (Electronic)9781538622308
DOIs
StatePublished - Oct 20 2017
Event2017 IEEE International Symposium on Electromagnetic Compatibility, Signal and Power Integrity, EMCSI 2017 - Washington, United States
Duration: Aug 7 2017Aug 11 2017

Publication series

NameIEEE International Symposium on Electromagnetic Compatibility
ISSN (Print)1077-4076
ISSN (Electronic)2158-1118

Other

Other2017 IEEE International Symposium on Electromagnetic Compatibility, Signal and Power Integrity, EMCSI 2017
CountryUnited States
CityWashington
Period8/7/178/11/17

ASJC Scopus subject areas

  • Condensed Matter Physics
  • Electrical and Electronic Engineering

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  • Cite this

    Ma, X., Chen, X., Rong, A., Schutt-Aine, J. E., & Cangellaris, A. C. (2017). Stochastic electromagnetic-circuit simulation for system-level EMI analysis. In 2017 IEEE International Symposium on Electromagnetic Compatibility, Signal and Power Integrity, EMCSI 2017 - Proceedings (pp. 118-123). [8077852] (IEEE International Symposium on Electromagnetic Compatibility). Institute of Electrical and Electronics Engineers Inc.. https://doi.org/10.1109/ISEMC.2017.8077852