Step-Edge and Stacked-Heterostructure High-Tc Josephson Junctions for Voltage-Standard Arrays

S. P. Benz, C. D. Reintsema, R. H. Ono, I. Bozovic, G. F. Virshup, J. N. Eckstein

Research output: Contribution to journalArticlepeer-review

Abstract

We have explored two high-transition-temperature Josephson junction technologies for application in voltage standard arrays: step-edge junctions made with YBa2Cu3O7-δ and Au normal-metal bridges, and stacked series arrays of Josephson junctions in selectively doped, epitaxially grown Bi2Sr2CaCu2O8 heterostructures. For both kinds of junctions, Shapiro steps induced by a microwave bias were characterized as a function of power. We compare the two technologies with respect to critical current and normal resistance uniformity, maximum achievable critical current, critical-current normal-resistance product, and operating temperature.

Original languageEnglish (US)
Pages (from-to)2915-2918
Number of pages4
JournalIEEE Transactions on Applied Superconductivity
Volume5
Issue number2
DOIs
StatePublished - Jun 1995
Externally publishedYes

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Condensed Matter Physics
  • Electrical and Electronic Engineering

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