Circuit reliability under statistical process variation is an area of growing concern. For highly replicated circuits such as SRAMs and flip-flops, a rare statistical event for one circuit may induce a not-so-rare system failure. Existing techniques perform poorly when tasked to generate both efficient sampling and sound statistics for these rare events. Statistical Blockade is a novel Monte Carlo technique that allows us to efficiently filter-to block-unwanted samples insufficiently rare in the tail distributions we seek. The method synthesizes ideas from data mining and Extreme Value Theory, and shows speed-ups of x10-x100 over standard Monte Carlo.
|Original language||English (US)|
|Title of host publication||Design, Automation, and Test in Europe|
|Subtitle of host publication||The Most Influential Papers of 10 Years Date|
|Number of pages||17|
|State||Published - Dec 1 2008|
ASJC Scopus subject areas