Spin Seebeck devices using local on-chip heating

Stephen M. Wu, Frank Y. Fradin, Jason Hoffman, Axel Hoffmann, Anand Bhattacharya

Research output: Contribution to journalArticlepeer-review

Abstract

A micro-patterned spin Seebeck device is fabricated using an on-chip heater. Current is driven through a Au heater layer electrically isolated from a bilayer consisting of Fe3O4 (insulating ferrimagnet) and a spin detector layer. It is shown that through this method it is possible to measure the longitudinal spin Seebeck effect (SSE) for small area magnetic devices, equivalent to traditional macroscopic SSE experiments. Using a lock-in detection technique, it is possible to more sensitively characterize both the SSE and the anomalous Nernst effect (ANE), as well as the inverse spin Hall effect in various spin detector materials. By using the spin detector layer as a thermometer, we can obtain a value for the temperature gradient across the device. These results are well matched to values obtained through electromagnetic/thermal modeling of the device structure and with large area spin Seebeck measurements.

Original languageEnglish (US)
Article number17C509
JournalJournal of Applied Physics
Volume117
Issue number17
DOIs
StatePublished - May 7 2015
Externally publishedYes

ASJC Scopus subject areas

  • Physics and Astronomy(all)

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