TY - GEN
T1 - Special Session
T2 - 37th IEEE VLSI Test Symposium, VTS 2019
AU - Bahar, R. Iris
AU - Karpuzcu, Ulya
AU - Misailovic, Sasa
N1 - Publisher Copyright:
© 2019 IEEE.
PY - 2019/4
Y1 - 2019/4
N2 - Many important application domains, including machine learning, feature intrinsically noise tolerant algorithms. These algorithms process massive, yet noisy and redundant data, by probabilistic and often iterative techniques. As a result, there is a range of valid outputs rather than a single golden value. While this may translate into relaxed constraints for testing and verification of approximate systems, distinguishing actual design bugs from what is being approximated also becomes harder. In this paper, using representative case studies, we pose several challenges for the test and verification community as approximate computing becomes more prevalent as a design of choice in order to achieve performance gains, power or energy savings, improved reliability or reduced software and/or hardware complexity.
AB - Many important application domains, including machine learning, feature intrinsically noise tolerant algorithms. These algorithms process massive, yet noisy and redundant data, by probabilistic and often iterative techniques. As a result, there is a range of valid outputs rather than a single golden value. While this may translate into relaxed constraints for testing and verification of approximate systems, distinguishing actual design bugs from what is being approximated also becomes harder. In this paper, using representative case studies, we pose several challenges for the test and verification community as approximate computing becomes more prevalent as a design of choice in order to achieve performance gains, power or energy savings, improved reliability or reduced software and/or hardware complexity.
UR - http://www.scopus.com/inward/record.url?scp=85069172442&partnerID=8YFLogxK
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U2 - 10.1109/VTS.2019.8758649
DO - 10.1109/VTS.2019.8758649
M3 - Conference contribution
AN - SCOPUS:85069172442
T3 - Proceedings of the IEEE VLSI Test Symposium
BT - 2019 IEEE 37th VLSI Test Symposium, VTS 2019
PB - IEEE Computer Society
Y2 - 23 April 2019 through 25 April 2019
ER -