@article{e8461b6d8ada45beb089314899a347ac,
title = "Special Issue on Reliability",
author = "Souvik Mahapatra and Chen, \{Kevin J.\} and Ben Kaczer and Lucio Pancheri and Elyse Rosenbaum and Chandra Mouli and Hei Wong and Andreas Kerber and \{Monzio Compagnoni\}, Christian and Randy Koval and Gaudenzio Meneghesso and David Sheridan and Stephen Ramey and Runsheng Wang and Jim Stathis",
note = "Dr. Wang was awarded the IEEE EDS Early Career Award by the IEEE Electron Device Society (EDS), the NSFC Award for Excellent Young Scientists by the National Natural Science Foundation of China (NSFC), the Natural Science Award (First Prize) by the Ministry of Education (MOE) of China, and many other awards. He has served on the Technical Program Committee of many conferences, including IEDM and IRPS. He serves on the Editorial Board of the IEEE TRANSACTIONS ON ELECTRON DEVICES, Scientific Reports, and Science China Information Sciences. Dr. Rosenbaum was a recipient of the Best Student Paper Award from the IEDM, the Outstanding and Best Paper Awards from the EOS/ESD Symposium, the Technical Excellence Award from the SRC, the NSF CAREER Award, the IBM Faculty Award, and the ESD Association{\textquoteright}s Industry Pioneer Recognition Award. She has been an Editor of the IEEE TRANSACTIONS ON DEVICE AND MATERIALS RELIABILITY and the IEEE TRANSACTIONS ON ELECTRON DEVICES.",
year = "2019",
month = nov,
doi = "10.1109/TED.2019.2943987",
language = "English (US)",
volume = "66",
pages = "4497--4503",
journal = "IEEE Transactions on Electron Devices",
issn = "0018-9383",
publisher = "Institute of Electrical and Electronics Engineers Inc.",
number = "11",
}