Special Issue on Reliability

Souvik Mahapatra, Kevin J. Chen, Ben Kaczer, Lucio Pancheri, Elyse Rosenbaum, Chandra Mouli, Hei Wong, Andreas Kerber, Christian Monzio Compagnoni, Randy Koval, Gaudenzio Meneghesso, David Sheridan, Stephen Ramey, Runsheng Wang, Jim Stathis

Research output: Contribution to journalEditorial

Original languageEnglish (US)
Article number8886623
Pages (from-to)4497-4503
Number of pages7
JournalIEEE Transactions on Electron Devices
Volume66
Issue number11
DOIs
StatePublished - Nov 2019

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Electrical and Electronic Engineering

Cite this

Mahapatra, S., Chen, K. J., Kaczer, B., Pancheri, L., Rosenbaum, E., Mouli, C., ... Stathis, J. (2019). Special Issue on Reliability. IEEE Transactions on Electron Devices, 66(11), 4497-4503. [8886623]. https://doi.org/10.1109/TED.2019.2943987

Special Issue on Reliability. / Mahapatra, Souvik; Chen, Kevin J.; Kaczer, Ben; Pancheri, Lucio; Rosenbaum, Elyse; Mouli, Chandra; Wong, Hei; Kerber, Andreas; Monzio Compagnoni, Christian; Koval, Randy; Meneghesso, Gaudenzio; Sheridan, David; Ramey, Stephen; Wang, Runsheng; Stathis, Jim.

In: IEEE Transactions on Electron Devices, Vol. 66, No. 11, 8886623, 11.2019, p. 4497-4503.

Research output: Contribution to journalEditorial

Mahapatra, S, Chen, KJ, Kaczer, B, Pancheri, L, Rosenbaum, E, Mouli, C, Wong, H, Kerber, A, Monzio Compagnoni, C, Koval, R, Meneghesso, G, Sheridan, D, Ramey, S, Wang, R & Stathis, J 2019, 'Special Issue on Reliability', IEEE Transactions on Electron Devices, vol. 66, no. 11, 8886623, pp. 4497-4503. https://doi.org/10.1109/TED.2019.2943987
Mahapatra S, Chen KJ, Kaczer B, Pancheri L, Rosenbaum E, Mouli C et al. Special Issue on Reliability. IEEE Transactions on Electron Devices. 2019 Nov;66(11):4497-4503. 8886623. https://doi.org/10.1109/TED.2019.2943987
Mahapatra, Souvik ; Chen, Kevin J. ; Kaczer, Ben ; Pancheri, Lucio ; Rosenbaum, Elyse ; Mouli, Chandra ; Wong, Hei ; Kerber, Andreas ; Monzio Compagnoni, Christian ; Koval, Randy ; Meneghesso, Gaudenzio ; Sheridan, David ; Ramey, Stephen ; Wang, Runsheng ; Stathis, Jim. / Special Issue on Reliability. In: IEEE Transactions on Electron Devices. 2019 ; Vol. 66, No. 11. pp. 4497-4503.
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