Special Issue on Reliability

Souvik Mahapatra, Kevin J. Chen, Ben Kaczer, Lucio Pancheri, Elyse Rosenbaum, Chandra Mouli, Hei Wong, Andreas Kerber, Christian Monzio Compagnoni, Randy Koval, Gaudenzio Meneghesso, David Sheridan, Stephen Ramey, Runsheng Wang, Jim Stathis

Research output: Contribution to journalEditorial

Original languageEnglish (US)
Article number8886623
Pages (from-to)4497-4503
Number of pages7
JournalIEEE Transactions on Electron Devices
Issue number11
StatePublished - Nov 2019

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Electrical and Electronic Engineering

Cite this

Mahapatra, S., Chen, K. J., Kaczer, B., Pancheri, L., Rosenbaum, E., Mouli, C., ... Stathis, J. (2019). Special Issue on Reliability. IEEE Transactions on Electron Devices, 66(11), 4497-4503. [8886623]. https://doi.org/10.1109/TED.2019.2943987

Special Issue on Reliability. / Mahapatra, Souvik; Chen, Kevin J.; Kaczer, Ben; Pancheri, Lucio; Rosenbaum, Elyse; Mouli, Chandra; Wong, Hei; Kerber, Andreas; Monzio Compagnoni, Christian; Koval, Randy; Meneghesso, Gaudenzio; Sheridan, David; Ramey, Stephen; Wang, Runsheng; Stathis, Jim.

In: IEEE Transactions on Electron Devices, Vol. 66, No. 11, 8886623, 11.2019, p. 4497-4503.

Research output: Contribution to journalEditorial

Mahapatra, S, Chen, KJ, Kaczer, B, Pancheri, L, Rosenbaum, E, Mouli, C, Wong, H, Kerber, A, Monzio Compagnoni, C, Koval, R, Meneghesso, G, Sheridan, D, Ramey, S, Wang, R & Stathis, J 2019, 'Special Issue on Reliability', IEEE Transactions on Electron Devices, vol. 66, no. 11, 8886623, pp. 4497-4503. https://doi.org/10.1109/TED.2019.2943987
Mahapatra S, Chen KJ, Kaczer B, Pancheri L, Rosenbaum E, Mouli C et al. Special Issue on Reliability. IEEE Transactions on Electron Devices. 2019 Nov;66(11):4497-4503. 8886623. https://doi.org/10.1109/TED.2019.2943987
Mahapatra, Souvik ; Chen, Kevin J. ; Kaczer, Ben ; Pancheri, Lucio ; Rosenbaum, Elyse ; Mouli, Chandra ; Wong, Hei ; Kerber, Andreas ; Monzio Compagnoni, Christian ; Koval, Randy ; Meneghesso, Gaudenzio ; Sheridan, David ; Ramey, Stephen ; Wang, Runsheng ; Stathis, Jim. / Special Issue on Reliability. In: IEEE Transactions on Electron Devices. 2019 ; Vol. 66, No. 11. pp. 4497-4503.
title = "Special Issue on Reliability",
author = "Souvik Mahapatra and Chen, {Kevin J.} and Ben Kaczer and Lucio Pancheri and Elyse Rosenbaum and Chandra Mouli and Hei Wong and Andreas Kerber and {Monzio Compagnoni}, Christian and Randy Koval and Gaudenzio Meneghesso and David Sheridan and Stephen Ramey and Runsheng Wang and Jim Stathis",
year = "2019",
month = "11",
doi = "10.1109/TED.2019.2943987",
language = "English (US)",
volume = "66",
pages = "4497--4503",
journal = "IEEE Transactions on Electron Devices",
issn = "0018-9383",
publisher = "Institute of Electrical and Electronics Engineers Inc.",
number = "11",



T1 - Special Issue on Reliability

AU - Mahapatra, Souvik

AU - Chen, Kevin J.

AU - Kaczer, Ben

AU - Pancheri, Lucio

AU - Rosenbaum, Elyse

AU - Mouli, Chandra

AU - Wong, Hei

AU - Kerber, Andreas

AU - Monzio Compagnoni, Christian

AU - Koval, Randy

AU - Meneghesso, Gaudenzio

AU - Sheridan, David

AU - Ramey, Stephen

AU - Wang, Runsheng

AU - Stathis, Jim

PY - 2019/11

Y1 - 2019/11

UR - http://www.scopus.com/inward/record.url?scp=85074514886&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=85074514886&partnerID=8YFLogxK

U2 - 10.1109/TED.2019.2943987

DO - 10.1109/TED.2019.2943987

M3 - Editorial

AN - SCOPUS:85074514886

VL - 66

SP - 4497

EP - 4503

JO - IEEE Transactions on Electron Devices

JF - IEEE Transactions on Electron Devices

SN - 0018-9383

IS - 11

M1 - 8886623

ER -