SOI poly-defined diode for ESD protection in high speed I/Os

Victor Chen, Akram Salman, Stephen Beebe, Elyse Rosenbaum, Souvick Mitra, Chris Putnam, Robert Gauthier

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Original languageEnglish (US)
Title of host publication2006 IEEE International Reliability Physics Symposium Proceedings, 44th Annual
Pages635-636
Number of pages2
DOIs
StatePublished - Dec 1 2006
Event44th Annual IEEE International Reliability Physics Symposium, IRPS 2006 - San Jose, CA, United States
Duration: Mar 26 2006Mar 30 2006

Publication series

NameIEEE International Reliability Physics Symposium Proceedings
ISSN (Print)1541-7026

Other

Other44th Annual IEEE International Reliability Physics Symposium, IRPS 2006
CountryUnited States
CitySan Jose, CA
Period3/26/063/30/06

ASJC Scopus subject areas

  • Engineering(all)

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